{"title":"低温测量法检测自旋转移磁化开关的本征临界电流","authors":"K. Yagami, A. Tulapurkar, A. Fukushima, Y. Suzuki","doi":"10.1109/INTMAG.2005.1463501","DOIUrl":null,"url":null,"abstract":"Low-temperature measurements of spin-transfer magnetization switching are carried out. The extrapolated critical currents at /spl tau/=0 K (I/sub c//sup 0K/) are then compared with that at /spl tau/=/spl tau//sub 0/ (I/sub c0/) as well as with switching currents measured by ns-pulsed currents. To estimate currents for nano-second writing where no thermal switching happens, I/sub c//sup 0K/, not I/sub c0/, must be known since I/sub c0/ has temperature dependence.","PeriodicalId":273174,"journal":{"name":"INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Inspection of intrinsic critical currents for spin-transfer magnetization switching by low-temperature measurements\",\"authors\":\"K. Yagami, A. Tulapurkar, A. Fukushima, Y. Suzuki\",\"doi\":\"10.1109/INTMAG.2005.1463501\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Low-temperature measurements of spin-transfer magnetization switching are carried out. The extrapolated critical currents at /spl tau/=0 K (I/sub c//sup 0K/) are then compared with that at /spl tau/=/spl tau//sub 0/ (I/sub c0/) as well as with switching currents measured by ns-pulsed currents. To estimate currents for nano-second writing where no thermal switching happens, I/sub c//sup 0K/, not I/sub c0/, must be known since I/sub c0/ has temperature dependence.\",\"PeriodicalId\":273174,\"journal\":{\"name\":\"INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-04-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INTMAG.2005.1463501\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INTMAG.2005.1463501","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Inspection of intrinsic critical currents for spin-transfer magnetization switching by low-temperature measurements
Low-temperature measurements of spin-transfer magnetization switching are carried out. The extrapolated critical currents at /spl tau/=0 K (I/sub c//sup 0K/) are then compared with that at /spl tau/=/spl tau//sub 0/ (I/sub c0/) as well as with switching currents measured by ns-pulsed currents. To estimate currents for nano-second writing where no thermal switching happens, I/sub c//sup 0K/, not I/sub c0/, must be known since I/sub c0/ has temperature dependence.
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