{"title":"组合逻辑电路中的路径选择","authors":"W. Li, S. Reddy, S. Sahni","doi":"10.1109/DAC.1988.14749","DOIUrl":null,"url":null,"abstract":"The authors have developed a polynomial-time algorithm to find a minimum cardinality path set that can be used to verify the correct operation of a digital circuit. Although they have assumed that the circuit under consideration is a combinational logic circuit constructed from AND, OR, NAND, NOR, and NOT gates, circuits containing other types of gates can be accommodated by using an appropriate circuit model for such gates. The algorithms are also directly applicable to sequential circuits that use the so-called scan design, since in such circuits it is only necessary to test the combinational circuit embedded between latches.<<ETX>>","PeriodicalId":230716,"journal":{"name":"25th ACM/IEEE, Design Automation Conference.Proceedings 1988.","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"180","resultStr":"{\"title\":\"On path selection in combinational logic circuits\",\"authors\":\"W. Li, S. Reddy, S. Sahni\",\"doi\":\"10.1109/DAC.1988.14749\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors have developed a polynomial-time algorithm to find a minimum cardinality path set that can be used to verify the correct operation of a digital circuit. Although they have assumed that the circuit under consideration is a combinational logic circuit constructed from AND, OR, NAND, NOR, and NOT gates, circuits containing other types of gates can be accommodated by using an appropriate circuit model for such gates. The algorithms are also directly applicable to sequential circuits that use the so-called scan design, since in such circuits it is only necessary to test the combinational circuit embedded between latches.<<ETX>>\",\"PeriodicalId\":230716,\"journal\":{\"name\":\"25th ACM/IEEE, Design Automation Conference.Proceedings 1988.\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"180\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"25th ACM/IEEE, Design Automation Conference.Proceedings 1988.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1988.14749\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"25th ACM/IEEE, Design Automation Conference.Proceedings 1988.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1988.14749","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The authors have developed a polynomial-time algorithm to find a minimum cardinality path set that can be used to verify the correct operation of a digital circuit. Although they have assumed that the circuit under consideration is a combinational logic circuit constructed from AND, OR, NAND, NOR, and NOT gates, circuits containing other types of gates can be accommodated by using an appropriate circuit model for such gates. The algorithms are also directly applicable to sequential circuits that use the so-called scan design, since in such circuits it is only necessary to test the combinational circuit embedded between latches.<>