经验功率MOSFET建模:实际表征和仿真植入

G. Verneau, L. Aubard, J. Crebier, C. Schaeffer, J. Schanen
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引用次数: 27

摘要

本研究涉及功率MOSFET模型。寄生电容是动态模型的主要参数之一,对开关波形和开关损耗有重要影响。大多数经典模型认为这些电容器是单电压依赖的。本文的目的是基于对开关转换过程中电荷位置和移动以及波形的物理结构分析,提出一种新的见解。建立了临界电压变化模型,并与实验曲线进行了比较。该模型似乎比PSPICE或制造商原始模型更准确,更可靠。
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Empirical power MOSFET modeling: practical characterization and simulation implantation
This study deals with power MOSFET models. Parasitic capacitors are one of the main parameters for dynamic models, and have a critical influence on switching waveforms and switching losses. Most of classical models consider that these capacitors are one-voltage dependent. The aim of this paper is to present a new insight based on a physical structure analysis of charge locations and moves and electrical waveforms, both during switching transitions. Establishment of the model with respect to critical voltage changes is presented, and results are compared with experimental curves. This model appears to be more accurate and more reliable than PSPICE or manufacturer original models.
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