{"title":"多导体传输线互连拓扑的频域分析","authors":"T. Rahal-Arabi, R. Suarez-Gartner, K.M. Lape","doi":"10.1109/ARFTG.1992.327001","DOIUrl":null,"url":null,"abstract":"This paper presents a frequency domain technique for optimization, sensitivity, and robustness analysis of large high speed lossy multi-conductor transmission line networks in VLSI regimes. The technique is used to compare several interconnect topologies in terms of their electrical performance. Finally, to demonstrate the usefulness and accuracy of the technique, the numerical frequency domain results have been validated by independent time domain simulations.","PeriodicalId":130939,"journal":{"name":"40th ARFTG Conference Digest","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Frequency Domain Analysis of Multi-Conductor Transmission Line Interconnect Topologies\",\"authors\":\"T. Rahal-Arabi, R. Suarez-Gartner, K.M. Lape\",\"doi\":\"10.1109/ARFTG.1992.327001\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a frequency domain technique for optimization, sensitivity, and robustness analysis of large high speed lossy multi-conductor transmission line networks in VLSI regimes. The technique is used to compare several interconnect topologies in terms of their electrical performance. Finally, to demonstrate the usefulness and accuracy of the technique, the numerical frequency domain results have been validated by independent time domain simulations.\",\"PeriodicalId\":130939,\"journal\":{\"name\":\"40th ARFTG Conference Digest\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"40th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1992.327001\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"40th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1992.327001","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Frequency Domain Analysis of Multi-Conductor Transmission Line Interconnect Topologies
This paper presents a frequency domain technique for optimization, sensitivity, and robustness analysis of large high speed lossy multi-conductor transmission line networks in VLSI regimes. The technique is used to compare several interconnect topologies in terms of their electrical performance. Finally, to demonstrate the usefulness and accuracy of the technique, the numerical frequency domain results have been validated by independent time domain simulations.
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