{"title":"电源噪声的主动模内抑制","authors":"Gokce Keskin, Xin Li, L. Pileggi","doi":"10.1109/CICC.2006.321012","DOIUrl":null,"url":null,"abstract":"An active on-chip circuit is demonstrated in 130nm CMOS for the suppression of on-chip power supply noise due to power distribution resonance. Testchip measurement results indicate up to 40% reduction in power supply noise during clock/power gating at a 2% power and 6% area overhead cost. Oscillation time is reduced by 50%. Simulation results show that comparable overshoot/undershoot and ringing control via on-chip decoupling would require significantly more area and power due to leakage, particularly at 90nm and below","PeriodicalId":269854,"journal":{"name":"IEEE Custom Integrated Circuits Conference 2006","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Active On-Die Suppression of Power Supply Noise\",\"authors\":\"Gokce Keskin, Xin Li, L. Pileggi\",\"doi\":\"10.1109/CICC.2006.321012\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An active on-chip circuit is demonstrated in 130nm CMOS for the suppression of on-chip power supply noise due to power distribution resonance. Testchip measurement results indicate up to 40% reduction in power supply noise during clock/power gating at a 2% power and 6% area overhead cost. Oscillation time is reduced by 50%. Simulation results show that comparable overshoot/undershoot and ringing control via on-chip decoupling would require significantly more area and power due to leakage, particularly at 90nm and below\",\"PeriodicalId\":269854,\"journal\":{\"name\":\"IEEE Custom Integrated Circuits Conference 2006\",\"volume\":\"74 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Custom Integrated Circuits Conference 2006\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.2006.321012\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Custom Integrated Circuits Conference 2006","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2006.321012","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An active on-chip circuit is demonstrated in 130nm CMOS for the suppression of on-chip power supply noise due to power distribution resonance. Testchip measurement results indicate up to 40% reduction in power supply noise during clock/power gating at a 2% power and 6% area overhead cost. Oscillation time is reduced by 50%. Simulation results show that comparable overshoot/undershoot and ringing control via on-chip decoupling would require significantly more area and power due to leakage, particularly at 90nm and below