{"title":"电子器件制造过程控制效率","authors":"N. Bagdanavičius, A. Žickis","doi":"10.1109/ITI.2004.242268","DOIUrl":null,"url":null,"abstract":"General conception of efficiency of electronic devices (ED) manufacturing process control was presented. New efficiency evaluation index was introduced. Key efficiency evaluation principles were covered. Block scheme of ED manufacturing process was presented. Quality transfer function was described. Manufacturing quality control structure of ED printed mounting unit (PMU) was examined. Overall (systemic) influence of separate control versions on its efficiency was emphasized. The necessity of analysis and synthesis of PMU quality control systems was emphasized. Method for calculating task fulfillment probability of two-level hierarchical control management system was introduced","PeriodicalId":320305,"journal":{"name":"26th International Conference on Information Technology Interfaces, 2004.","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Efficiency of electronic device manufacturing process control\",\"authors\":\"N. Bagdanavičius, A. Žickis\",\"doi\":\"10.1109/ITI.2004.242268\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"General conception of efficiency of electronic devices (ED) manufacturing process control was presented. New efficiency evaluation index was introduced. Key efficiency evaluation principles were covered. Block scheme of ED manufacturing process was presented. Quality transfer function was described. Manufacturing quality control structure of ED printed mounting unit (PMU) was examined. Overall (systemic) influence of separate control versions on its efficiency was emphasized. The necessity of analysis and synthesis of PMU quality control systems was emphasized. Method for calculating task fulfillment probability of two-level hierarchical control management system was introduced\",\"PeriodicalId\":320305,\"journal\":{\"name\":\"26th International Conference on Information Technology Interfaces, 2004.\",\"volume\":\"76 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"26th International Conference on Information Technology Interfaces, 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ITI.2004.242268\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"26th International Conference on Information Technology Interfaces, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITI.2004.242268","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Efficiency of electronic device manufacturing process control
General conception of efficiency of electronic devices (ED) manufacturing process control was presented. New efficiency evaluation index was introduced. Key efficiency evaluation principles were covered. Block scheme of ED manufacturing process was presented. Quality transfer function was described. Manufacturing quality control structure of ED printed mounting unit (PMU) was examined. Overall (systemic) influence of separate control versions on its efficiency was emphasized. The necessity of analysis and synthesis of PMU quality control systems was emphasized. Method for calculating task fulfillment probability of two-level hierarchical control management system was introduced