大功率led一级互连用银和铜烧结的评价

Sri Krishna Bhogaraju, A. Hanss, M. Schmid, G. Elger, F. Conti
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引用次数: 12

摘要

银烧结,众所周知的电力电子应用,正在迁移到光电组装,以取代其他互连材料,如共晶Au80Sn20或SnAgCu焊料。烧结提供了一种可以在低温下形成的互连,同时可以在高温下运行。本文的研究目标是开发一种可以取代传统的AuSn或SnAgCu (SAC)焊料的烧结互连,具有低热阻,足够的剪切强度和热机械抗疲劳性。银具有优异的热性能,在低机械应力应用的情况下可以成为有效的替代品。但由于铜具有较高的屈服强度和较低的材料成本,因此在具有高热机械应力的应用中,铜是首选材料。建立了银有压烧结和无压烧结的工艺条件。在机械和热性能方面,与参考SAC305焊料匹配的稳定互连已经实现,银在有压烧结时的平均抗剪强度为59MPa,无压烧结时的平均抗剪强度为42MPa,而参考SAC305焊料的平均抗剪强度为56MPa。通过瞬态热分析(TTA)测量的热性能显示,与参考SAC305焊料相比,银在有压烧结和无压烧结的热阻分别为0.8 k /W和0.5 k /W,这是基于材料的导热性所期望的。颗粒尺寸、结合材料、结合力和结合气氛对银烧结互连体的质量有重要影响。在无压烧结的情况下,与仅含有微米级颗粒的浆料相比,由亚微米级和纳米级银颗粒组成的浆料提供更少的多孔互连。铜纳米粉烧结的一个主要挑战是在烧结过程中确保还原性气体的充分渗透。在力学(4MPa)和热性能方面也观察到这一点。实验用浆料中还原剂不足。在此基础上,需要制定提高粘合剂化学活性的策略。
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Evaluation of silver and copper sintering of first level interconnects for high power LEDs
Silver sintering, well known in power electronic applications, is migrating into optoelectronic assembly, to replace other interconnect materials like the eutectic Au80Sn20 or SnAgCu solder. Sintering offers an interconnect that can be formed at low temperature while at the same time can operate at high temperature. The goal of the research of this paper is to develop a sintered interconnect which can replace traditional AuSn or SnAgCu (SAC) solder, offering low thermal resistance, sufficient shear strength and thermo-mechanical fatigue resistance. Silver offers excellent thermal properties and can be an effective replacement in case of low mechanical stress applications. But copper is in case of applications with high thermo-mechanical stress the material of choice due to its higher yield strength and in general due to lower material cost.Process conditions in case of silver sintering under pressure and pressureless silver sintering have been established. A stable interconnect matching the reference SAC305 solder in terms of mechanical and thermal performance has been realized returning shear strength values averaging 59MPa for silver sintering under pressure and 42MPa for pressureless sintering as against the reference SAC305 solder averaging 56MPa. The thermal performance, measured by transient thermal analysis (TTA) reveal the lower thermal resistance of 0,8K/W and 0,5K/W for silver sintering under pressure and pressureless silver sintering respectively, as against the reference SAC305 solder as expected based on the thermal conductivity of the material. Particles size, binding material, bonding force and bonding atmosphere are shown to have a major impact on the quality of the silver sintered interconnect. Pastes consisting sub-micron and nanoscale silver particles provide less porous interconnect compared to paste containing solely micron sized particles in case of pressureless sintering.A major challenge with regards to copper nano-powder based sintering is to ensure sufficient penetration of the reducing gas during the sintering process. This is observed also in terms of the mechanical (4MPa) as well as the thermal performance. The paste used in the experiments has not sufficient reducing agents. Based on the results strategies to improve the activation need to be developed for the binder chemistry.
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