基于gpu的小延迟缺陷时序感知测试生成

Kuan-Yu Liao, Po-Juei Chen, Ang-Feng Lin, C. Li, M. Hsiao, Laung-Terng Wang
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引用次数: 7

摘要

为了生成紧凑的高质量测试集,提出了一种基于gpu的时间感知ATPG。测试生成算法沿着多个长路径回溯和传播,以便同时生成许多测试模式。然后对生成的测试模式进行故障模拟和选择。与基于8核cpu的定时感知商用ATPG相比,所提出的基于gpu的技术在大型基准电路上的测试长度减少了36%,而SDQL质量几乎保持不变。
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GPU-based timing-aware test generation for small delay defects
A GPU-based timing-aware ATPG is proposed to generate a compact high-quality test set. The test generation algorithm backtraces and propagates along multiple long paths so that many test patterns are generated at the same time. Generated test patterns are then fault simulated and selected. Compared with an 8-core CPU-based timing-aware commercial ATPG, the proposed GPU-based technique achieved 36% test length reductions on large benchmark circuits while the SDQL quality remains almost the same.
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