负折射率超材料作为无源超高频RFID标签嵌体的应用

D. Arumugam, D. Engels
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引用次数: 1

摘要

近年来,人们对负折射率(NRI)超材料的物理性质进行了大量的研究[1,2],并将其应用于实验研究。NRI超材料是具有负介电常数(εr)和负磁导率(μr)的制备材料。这些材料最早是由Vaselago于1967年提出的[3],他们对这些材料进行了理论研究,得出了这样的结论:这些介质应该被认为具有负折射率,因为(n = -√Εμ)。由于对物理概念的非常规使用以及当时不存在具有这些行为的材料,这一提议遭到了许多批评。近十年来,NRI超材料的研究引起了理论物理学家和实验物理学家的极大兴趣。最近令人兴奋的是,NRM现在已经通过利用a - μr和a - εr材料(s)组合的制造技术在实验中被发现[1]。此外,Pendry[4]预测并验证了NRM可以作为比传统透镜更高分辨率的完美透镜,这提供了所需的突破。
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The utility of negative refractive index metamaterials as passive UHF RFID tag inlays
Recently, there has been much work in exploring the physics of negative refractive index (NRI) metamaterials [1, 2] as applicable experimentally. NRI metamaterials are fabricated materials that have negative permittivity (εr) and permeability (μr) values. These materials were first suggested in 1967 by Vaselago [3], where they were theoretically studied to reach the proposed conclusion that such mediums should be deemed as possessing negative refractive indexes since (n = −√Εμ). This proposal endured many criticisms, due to the unconventional utilization of physical concepts and non-existence of materials possessing these behaviors at that time. In the last decade, the study of NRI metamaterials (NRM) has experienced huge interests spanning both theoretical and experimental physicist. This recent excitement is due to the fact that NRM's have now been discovered experimentally through fabrication techniques utilizing the combination of a −μr and a −εr material(s) [1]. Furthermore, the prediction and verification by Pendry [4] that NRM's could be utilized as perfect lenses with higher resolutions than conventional lenses provided the required breakthrough.
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