高压应力下绝缘子表面闪络发光的光谱观察

R. Sundararaman, C. Li, S. Goode, T. Sudarshan
{"title":"高压应力下绝缘子表面闪络发光的光谱观察","authors":"R. Sundararaman, C. Li, S. Goode, T. Sudarshan","doi":"10.1109/CEIDP.1993.378957","DOIUrl":null,"url":null,"abstract":"Spectroscopic investigations of the prebreakdown and breakdown luminescence of a dielectric surface under the application of a high-voltage pulse were performed in vacuum ambience on polycrystalline alumina. Information about the composition of the light emission was obtained with the aid of a 2D CCD (charge coupled device) camera interfaced with a flat field spectrometer. Time-resolved studies of the light emission were also done using two PMTs (photomultiplier) tubes with spectral response in the UV and visible region. The surface of the insulator was treated with different polishing media like silicon carbine discs and diamond paste in order to understand the role played by the surface microstructure of the sample. The results reported indicate that the surface treatment of a dielectric plays a very important role in the electrical performance of the insulator. In addition, it is evident that there are significant differences in the spectral nature of the light emission that can be observed from the spectrum of surface flashover from a SiC polished sample compared to that of an unpolished sample. A correlation between the electrical performance of the insulator and the development of the spectral nature of the light emission is indicated. All these interesting and important observations are being investigated in an extensive manner. The important role played by material defects and desorbed gases in the pre-breakdown phase of the surface flashover events are again confirmed.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Spectroscopic observations of light emission from surface flashover of insulators under high voltage stress\",\"authors\":\"R. Sundararaman, C. Li, S. Goode, T. Sudarshan\",\"doi\":\"10.1109/CEIDP.1993.378957\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Spectroscopic investigations of the prebreakdown and breakdown luminescence of a dielectric surface under the application of a high-voltage pulse were performed in vacuum ambience on polycrystalline alumina. Information about the composition of the light emission was obtained with the aid of a 2D CCD (charge coupled device) camera interfaced with a flat field spectrometer. Time-resolved studies of the light emission were also done using two PMTs (photomultiplier) tubes with spectral response in the UV and visible region. The surface of the insulator was treated with different polishing media like silicon carbine discs and diamond paste in order to understand the role played by the surface microstructure of the sample. The results reported indicate that the surface treatment of a dielectric plays a very important role in the electrical performance of the insulator. In addition, it is evident that there are significant differences in the spectral nature of the light emission that can be observed from the spectrum of surface flashover from a SiC polished sample compared to that of an unpolished sample. A correlation between the electrical performance of the insulator and the development of the spectral nature of the light emission is indicated. All these interesting and important observations are being investigated in an extensive manner. The important role played by material defects and desorbed gases in the pre-breakdown phase of the surface flashover events are again confirmed.<<ETX>>\",\"PeriodicalId\":149803,\"journal\":{\"name\":\"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.1993.378957\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1993.378957","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在真空环境下对多晶氧化铝介质表面在高压脉冲作用下的预击穿和击穿发光进行了光谱研究。利用二维CCD(电荷耦合器件)相机与平面场光谱仪相结合,获得了光发射成分的信息。光发射的时间分辨研究也进行了使用两个pmt(光电倍增管)管在紫外和可见光区域的光谱响应。采用卡宾硅片、金刚石膏等抛光介质对绝缘子表面进行抛光处理,了解样品表面微观结构对绝缘子表面的影响。结果表明,电介质的表面处理对绝缘体的电性能起着非常重要的作用。此外,很明显,从SiC抛光样品的表面闪络光谱中可以观察到的发光光谱性质与未抛光样品相比有显著差异。指出了绝缘体的电学性能与光发射光谱性质的发展之间的关系。所有这些有趣而重要的观察结果正在广泛地进行研究。再次证实了材料缺陷和解吸气体在表面闪络事件击穿前阶段的重要作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Spectroscopic observations of light emission from surface flashover of insulators under high voltage stress
Spectroscopic investigations of the prebreakdown and breakdown luminescence of a dielectric surface under the application of a high-voltage pulse were performed in vacuum ambience on polycrystalline alumina. Information about the composition of the light emission was obtained with the aid of a 2D CCD (charge coupled device) camera interfaced with a flat field spectrometer. Time-resolved studies of the light emission were also done using two PMTs (photomultiplier) tubes with spectral response in the UV and visible region. The surface of the insulator was treated with different polishing media like silicon carbine discs and diamond paste in order to understand the role played by the surface microstructure of the sample. The results reported indicate that the surface treatment of a dielectric plays a very important role in the electrical performance of the insulator. In addition, it is evident that there are significant differences in the spectral nature of the light emission that can be observed from the spectrum of surface flashover from a SiC polished sample compared to that of an unpolished sample. A correlation between the electrical performance of the insulator and the development of the spectral nature of the light emission is indicated. All these interesting and important observations are being investigated in an extensive manner. The important role played by material defects and desorbed gases in the pre-breakdown phase of the surface flashover events are again confirmed.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Partial discharged-induced aging of cast epoxies and related nonstationary behavior of the discharge statistics An adaptive filtering method for noise suppression in partial discharge measurements Gas integrity and adsorbent performance in an SF/sub 6/ circuit breaker after test duty Anomalous metal-polymer interface dependence of dielectric breakdown in polyvinylidene fluoride Study on radiation aging of polymeric insulating material by positron annihilation
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1