0.1 /spl mu/m以下CMOS小型化的问题及解决方案

H. Iwai, S. Ohmi
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引用次数: 1

摘要

MOS大规模集成电路的进步是通过其元件的不断小型化来实现的。然而,由于各种预期的限制,CMOS器件的小型化目前在0.1 /spl mu/m一代面临着严峻的困难。为了克服这些问题,研究了新材料和新器件结构的引入。本文阐述了将CMOS器件缩小到0.1 /spl mu/m以下的困难,然后展望了未来的CMOS新材料、新工艺和新结构技术有望解决这些问题。
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Problems and solutions for downsizing CMOS below 0.1 /spl mu/m
Progress of MOS LSI has been achieved by continuous downsizing of its components. However, the downsizing of CMOS devices is now facing severe difficulties at the 0.1 /spl mu/m generation because of various expected limitations. In order to overcome the problems, introduction of new materials and device structures are investigated. This paper explains the difficulties of downsizing CMOS devices below 0.1 /spl mu/m, and then, future CMOS technologies for new materials, processes and structures which are expected to solve the problems.
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