T. Tsukizawa, Atsushi Yoshimoto, H. Komori, K. Miyanaga, R. Kitamura, Y. Morishita, M. Irie, Yoichi Nagaso, Takeaki Watanabe, K. Takinami, N. Saito
{"title":"一个pvt变化容忍完全集成的60ghz收发器,用于IEEE 802.11ad","authors":"T. Tsukizawa, Atsushi Yoshimoto, H. Komori, K. Miyanaga, R. Kitamura, Y. Morishita, M. Irie, Yoichi Nagaso, Takeaki Watanabe, K. Takinami, N. Saito","doi":"10.1109/VLSIC.2014.6858416","DOIUrl":null,"url":null,"abstract":"A PVT tolerant fully integrated 60 GHz transceiver for IEEE 802.11ad is presented. By introducing a newly proposed self-sensing LDO, the transceiver adjusts bias currents and the LDO output voltage for the PA to minimize the output power variation while relaxing the hot carrier injection (HCI) degradation. The measurement shows excellent robustness against PVT variations, demonstrating only 5 dB output power variation over -20 °C to 85 °C across process corners.","PeriodicalId":381216,"journal":{"name":"2014 Symposium on VLSI Circuits Digest of Technical Papers","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"A PVT-variation tolerant fully integrated 60 GHz transceiver for IEEE 802.11ad\",\"authors\":\"T. Tsukizawa, Atsushi Yoshimoto, H. Komori, K. Miyanaga, R. Kitamura, Y. Morishita, M. Irie, Yoichi Nagaso, Takeaki Watanabe, K. Takinami, N. Saito\",\"doi\":\"10.1109/VLSIC.2014.6858416\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A PVT tolerant fully integrated 60 GHz transceiver for IEEE 802.11ad is presented. By introducing a newly proposed self-sensing LDO, the transceiver adjusts bias currents and the LDO output voltage for the PA to minimize the output power variation while relaxing the hot carrier injection (HCI) degradation. The measurement shows excellent robustness against PVT variations, demonstrating only 5 dB output power variation over -20 °C to 85 °C across process corners.\",\"PeriodicalId\":381216,\"journal\":{\"name\":\"2014 Symposium on VLSI Circuits Digest of Technical Papers\",\"volume\":\"61 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-06-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 Symposium on VLSI Circuits Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2014.6858416\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 Symposium on VLSI Circuits Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2014.6858416","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A PVT-variation tolerant fully integrated 60 GHz transceiver for IEEE 802.11ad
A PVT tolerant fully integrated 60 GHz transceiver for IEEE 802.11ad is presented. By introducing a newly proposed self-sensing LDO, the transceiver adjusts bias currents and the LDO output voltage for the PA to minimize the output power variation while relaxing the hot carrier injection (HCI) degradation. The measurement shows excellent robustness against PVT variations, demonstrating only 5 dB output power variation over -20 °C to 85 °C across process corners.