R. Schermer, F. Bucholtz, C. Villarruel, J. G. Gil, T. Andreadis, K. Williams
{"title":"脉冲微波对电光调制器的破坏","authors":"R. Schermer, F. Bucholtz, C. Villarruel, J. G. Gil, T. Andreadis, K. Williams","doi":"10.1109/avfop.2009.5342719","DOIUrl":null,"url":null,"abstract":"These results demonstrate the ability of a commercial LiNbO3 EO modulator to withstand damage from direct pulsed RF input up to 200 W. However, short-term disruption occurred at a few Watts, which suggests a need for improved modulator thermal design.","PeriodicalId":416780,"journal":{"name":"2009 IEEE Avionics, Fiber-Optics and Phototonics Technology Conference","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Disruption and damage of an electrooptic modulator by pulsed microwaves\",\"authors\":\"R. Schermer, F. Bucholtz, C. Villarruel, J. G. Gil, T. Andreadis, K. Williams\",\"doi\":\"10.1109/avfop.2009.5342719\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"These results demonstrate the ability of a commercial LiNbO3 EO modulator to withstand damage from direct pulsed RF input up to 200 W. However, short-term disruption occurred at a few Watts, which suggests a need for improved modulator thermal design.\",\"PeriodicalId\":416780,\"journal\":{\"name\":\"2009 IEEE Avionics, Fiber-Optics and Phototonics Technology Conference\",\"volume\":\"61 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE Avionics, Fiber-Optics and Phototonics Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/avfop.2009.5342719\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE Avionics, Fiber-Optics and Phototonics Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/avfop.2009.5342719","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Disruption and damage of an electrooptic modulator by pulsed microwaves
These results demonstrate the ability of a commercial LiNbO3 EO modulator to withstand damage from direct pulsed RF input up to 200 W. However, short-term disruption occurred at a few Watts, which suggests a need for improved modulator thermal design.