{"title":"下一代IP网络的测试技术","authors":"G. Nelson","doi":"10.1109/ATM.1999.786779","DOIUrl":null,"url":null,"abstract":"In this paper, we look at some examples of how \"IP meets ATM\" and then discuss some of the recent advances in IP standards. For the remainder of the paper, we examine testing techniques used in three different scenarios: functional testing of a layer 2/layer 3 switching device; class of service (CoS) contract verification in an IP network; interworking testing of an IP/ATM access device.","PeriodicalId":266412,"journal":{"name":"IEEE ATM Workshop '99 Proceedings (Cat. No. 99TH8462)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1999-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Testing techniques for next-generation IP networks\",\"authors\":\"G. Nelson\",\"doi\":\"10.1109/ATM.1999.786779\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we look at some examples of how \\\"IP meets ATM\\\" and then discuss some of the recent advances in IP standards. For the remainder of the paper, we examine testing techniques used in three different scenarios: functional testing of a layer 2/layer 3 switching device; class of service (CoS) contract verification in an IP network; interworking testing of an IP/ATM access device.\",\"PeriodicalId\":266412,\"journal\":{\"name\":\"IEEE ATM Workshop '99 Proceedings (Cat. No. 99TH8462)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-05-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE ATM Workshop '99 Proceedings (Cat. No. 99TH8462)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATM.1999.786779\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE ATM Workshop '99 Proceedings (Cat. No. 99TH8462)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATM.1999.786779","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Testing techniques for next-generation IP networks
In this paper, we look at some examples of how "IP meets ATM" and then discuss some of the recent advances in IP standards. For the remainder of the paper, we examine testing techniques used in three different scenarios: functional testing of a layer 2/layer 3 switching device; class of service (CoS) contract verification in an IP network; interworking testing of an IP/ATM access device.