{"title":"作为采样网络反射计采样器结构图形表示的w平面","authors":"D. Donahue, T. Barton","doi":"10.1109/arftg54656.2022.9896574","DOIUrl":null,"url":null,"abstract":"This paper presents a study of sampler configuration within a sampled-network reflectometer, an extension of the sampled-line. The sampled-network impedance sensing approach leverages a six- to four-port reduction technique that produces a graphical representation known as the w-plane. In this work, an experimental setup in which the samplers can be located near-arbitrarily within the network is used to explore the w-plane’s characteristics and relationship to the physical reflectometer.","PeriodicalId":375242,"journal":{"name":"2022 99th ARFTG Microwave Measurement Conference (ARFTG)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The w-Plane as a Graphical Representation of Sampler Configuration in a Sampled-Network Reflectometer\",\"authors\":\"D. Donahue, T. Barton\",\"doi\":\"10.1109/arftg54656.2022.9896574\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a study of sampler configuration within a sampled-network reflectometer, an extension of the sampled-line. The sampled-network impedance sensing approach leverages a six- to four-port reduction technique that produces a graphical representation known as the w-plane. In this work, an experimental setup in which the samplers can be located near-arbitrarily within the network is used to explore the w-plane’s characteristics and relationship to the physical reflectometer.\",\"PeriodicalId\":375242,\"journal\":{\"name\":\"2022 99th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 99th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/arftg54656.2022.9896574\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 99th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/arftg54656.2022.9896574","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The w-Plane as a Graphical Representation of Sampler Configuration in a Sampled-Network Reflectometer
This paper presents a study of sampler configuration within a sampled-network reflectometer, an extension of the sampled-line. The sampled-network impedance sensing approach leverages a six- to four-port reduction technique that produces a graphical representation known as the w-plane. In this work, an experimental setup in which the samplers can be located near-arbitrarily within the network is used to explore the w-plane’s characteristics and relationship to the physical reflectometer.