{"title":"电气噪声测量互连可靠性试验","authors":"G.H. Massiha, C.T.M. Chen","doi":"10.1109/SECON.1992.202257","DOIUrl":null,"url":null,"abstract":"The excess electrical noise in aluminum and aluminum alloy thin films were measured. The magnitude and frequency exponent for noise spectra of 1/f/sup alpha / were measured as a function of the sample temperature and current density. Two different regions in plots of normalized 1/f/sup alpha / noise magnitude, with alpha between 1.2 and 2.2. versus inverse temperature were observed. The time dependence experiment on excess noise of aluminum showed 1/f/sup alpha /, with alpha larger than 2.2, noise spectra during later stages of the electromigration process.<<ETX>>","PeriodicalId":230446,"journal":{"name":"Proceedings IEEE Southeastcon '92","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-04-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Reliability test of interconnections using electrical noise measurement\",\"authors\":\"G.H. Massiha, C.T.M. Chen\",\"doi\":\"10.1109/SECON.1992.202257\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The excess electrical noise in aluminum and aluminum alloy thin films were measured. The magnitude and frequency exponent for noise spectra of 1/f/sup alpha / were measured as a function of the sample temperature and current density. Two different regions in plots of normalized 1/f/sup alpha / noise magnitude, with alpha between 1.2 and 2.2. versus inverse temperature were observed. The time dependence experiment on excess noise of aluminum showed 1/f/sup alpha /, with alpha larger than 2.2, noise spectra during later stages of the electromigration process.<<ETX>>\",\"PeriodicalId\":230446,\"journal\":{\"name\":\"Proceedings IEEE Southeastcon '92\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-04-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings IEEE Southeastcon '92\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SECON.1992.202257\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings IEEE Southeastcon '92","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SECON.1992.202257","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability test of interconnections using electrical noise measurement
The excess electrical noise in aluminum and aluminum alloy thin films were measured. The magnitude and frequency exponent for noise spectra of 1/f/sup alpha / were measured as a function of the sample temperature and current density. Two different regions in plots of normalized 1/f/sup alpha / noise magnitude, with alpha between 1.2 and 2.2. versus inverse temperature were observed. The time dependence experiment on excess noise of aluminum showed 1/f/sup alpha /, with alpha larger than 2.2, noise spectra during later stages of the electromigration process.<>
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