{"title":"用低频介电响应监测辐射对环氧树脂样品的影响","authors":"A. Al-Attabi, R. Fouracre, H. M. Banford, H. Li","doi":"10.1109/CEIDP.1993.378920","DOIUrl":null,"url":null,"abstract":"Measurements of /spl epsi/\" as a function of frequency and temperature have been undertaken in a preliminary investigation of the effects of neutron radiation on samples of an epoxy resin. Samples were produced from a diglycidel ether of bisphenol A resin. Transient discharging currents were also measured, and attempts were made to analyze the data using either the Hamon approximation or a Fourier transform technique. The preliminary data indicate that the DC transient is not governed by a t/sup -n/ dependence. Fourier analysis of these data to obtain low-frequency dielectric information indicates the presence of a loss peak. The increase of /spl epsi/\" at lower frequencies observed in the loss analyzer data might be attributable to DC conductivity effects.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An investigation of low frequency dielectric response to monitor radiation induced changes in epoxy resin samples\",\"authors\":\"A. Al-Attabi, R. Fouracre, H. M. Banford, H. Li\",\"doi\":\"10.1109/CEIDP.1993.378920\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Measurements of /spl epsi/\\\" as a function of frequency and temperature have been undertaken in a preliminary investigation of the effects of neutron radiation on samples of an epoxy resin. Samples were produced from a diglycidel ether of bisphenol A resin. Transient discharging currents were also measured, and attempts were made to analyze the data using either the Hamon approximation or a Fourier transform technique. The preliminary data indicate that the DC transient is not governed by a t/sup -n/ dependence. Fourier analysis of these data to obtain low-frequency dielectric information indicates the presence of a loss peak. The increase of /spl epsi/\\\" at lower frequencies observed in the loss analyzer data might be attributable to DC conductivity effects.<<ETX>>\",\"PeriodicalId\":149803,\"journal\":{\"name\":\"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.1993.378920\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1993.378920","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An investigation of low frequency dielectric response to monitor radiation induced changes in epoxy resin samples
Measurements of /spl epsi/" as a function of frequency and temperature have been undertaken in a preliminary investigation of the effects of neutron radiation on samples of an epoxy resin. Samples were produced from a diglycidel ether of bisphenol A resin. Transient discharging currents were also measured, and attempts were made to analyze the data using either the Hamon approximation or a Fourier transform technique. The preliminary data indicate that the DC transient is not governed by a t/sup -n/ dependence. Fourier analysis of these data to obtain low-frequency dielectric information indicates the presence of a loss peak. The increase of /spl epsi/" at lower frequencies observed in the loss analyzer data might be attributable to DC conductivity effects.<>
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