{"title":"一种新的CMOS流水线ADC随机非线性分析方法","authors":"D. Goren, Eliyahu Shamsaev, I. Wagner","doi":"10.1145/378239.378370","DOIUrl":null,"url":null,"abstract":"An analytic approach is presented for estimating the nonlinearity of an analog to digital converter (ADC) as a function of the variations in the circuit devices. The approach is demonstrated for the case of a pipeline ADC with digital error correction. Under some mild assumptions on the expected variations, the error probability is expressed as a simple explicit function of the standard deviations in the components' parameters: gain errors, comparator offset errors and resistor errors. The analytical expression is verified for Integral Non Linearity (INL), and its limits are studied using Monte-Carlo simulations of a 10 bit pipeline ADC structure.","PeriodicalId":154316,"journal":{"name":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"A novel method for stochastic nonlinearity analysis of a CMOS pipeline ADC\",\"authors\":\"D. Goren, Eliyahu Shamsaev, I. Wagner\",\"doi\":\"10.1145/378239.378370\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An analytic approach is presented for estimating the nonlinearity of an analog to digital converter (ADC) as a function of the variations in the circuit devices. The approach is demonstrated for the case of a pipeline ADC with digital error correction. Under some mild assumptions on the expected variations, the error probability is expressed as a simple explicit function of the standard deviations in the components' parameters: gain errors, comparator offset errors and resistor errors. The analytical expression is verified for Integral Non Linearity (INL), and its limits are studied using Monte-Carlo simulations of a 10 bit pipeline ADC structure.\",\"PeriodicalId\":154316,\"journal\":{\"name\":\"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-06-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/378239.378370\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/378239.378370","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel method for stochastic nonlinearity analysis of a CMOS pipeline ADC
An analytic approach is presented for estimating the nonlinearity of an analog to digital converter (ADC) as a function of the variations in the circuit devices. The approach is demonstrated for the case of a pipeline ADC with digital error correction. Under some mild assumptions on the expected variations, the error probability is expressed as a simple explicit function of the standard deviations in the components' parameters: gain errors, comparator offset errors and resistor errors. The analytical expression is verified for Integral Non Linearity (INL), and its limits are studied using Monte-Carlo simulations of a 10 bit pipeline ADC structure.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
