{"title":"诊断在现代设计中只是体积的冰山一角","authors":"W. Huott","doi":"10.1109/TEST.2003.1271144","DOIUrl":null,"url":null,"abstract":"The pain of debug, from 1 silicon to volume ramp Debug, especially in custom chip design (i.e.: microprocessors), many times seems to be more of a reactionary “fly by the seat of your pants” art than a “well thought out” tools-based procedure to solution. In fact, it is quite difficult to define tools to do 1 silicon debug since it seems each new problem is somehow specifically associated to some particular design facet or interaction of that facet with the particular silicon process you’re operating in.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Diagnosis in modem design to volume the tip of the iceberg\",\"authors\":\"W. Huott\",\"doi\":\"10.1109/TEST.2003.1271144\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The pain of debug, from 1 silicon to volume ramp Debug, especially in custom chip design (i.e.: microprocessors), many times seems to be more of a reactionary “fly by the seat of your pants” art than a “well thought out” tools-based procedure to solution. In fact, it is quite difficult to define tools to do 1 silicon debug since it seems each new problem is somehow specifically associated to some particular design facet or interaction of that facet with the particular silicon process you’re operating in.\",\"PeriodicalId\":236182,\"journal\":{\"name\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"volume\":\"50 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2003.1271144\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1271144","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Diagnosis in modem design to volume the tip of the iceberg
The pain of debug, from 1 silicon to volume ramp Debug, especially in custom chip design (i.e.: microprocessors), many times seems to be more of a reactionary “fly by the seat of your pants” art than a “well thought out” tools-based procedure to solution. In fact, it is quite difficult to define tools to do 1 silicon debug since it seems each new problem is somehow specifically associated to some particular design facet or interaction of that facet with the particular silicon process you’re operating in.