{"title":"计算材料设计®:RRAM中开关机制的实现","authors":"S. Aspera, H. Kasai, Y. Tamai, N. Awaya","doi":"10.1109/INEC.2014.7460425","DOIUrl":null,"url":null,"abstract":"Computational materials design® (CMD®) has been proven to be a very powerful tool for developing novel materials through obtaining relevant understanding of the basic principles underlying a system. Among others, realization of the switching mechanism in resistance random access memory (RRAM) devices has been an interesting field. Here, we propose a mechanism of resistive switching in RRAM based on the change in the electronic properties of the transition metal oxide (TMO) layer through the occurrence of rowed oxygen vacancies.","PeriodicalId":188668,"journal":{"name":"2014 IEEE International Nanoelectronics Conference (INEC)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Computational materials design®: Realization of the switching mechanism in RRAM\",\"authors\":\"S. Aspera, H. Kasai, Y. Tamai, N. Awaya\",\"doi\":\"10.1109/INEC.2014.7460425\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Computational materials design® (CMD®) has been proven to be a very powerful tool for developing novel materials through obtaining relevant understanding of the basic principles underlying a system. Among others, realization of the switching mechanism in resistance random access memory (RRAM) devices has been an interesting field. Here, we propose a mechanism of resistive switching in RRAM based on the change in the electronic properties of the transition metal oxide (TMO) layer through the occurrence of rowed oxygen vacancies.\",\"PeriodicalId\":188668,\"journal\":{\"name\":\"2014 IEEE International Nanoelectronics Conference (INEC)\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-07-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE International Nanoelectronics Conference (INEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INEC.2014.7460425\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Nanoelectronics Conference (INEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INEC.2014.7460425","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Computational materials design®: Realization of the switching mechanism in RRAM
Computational materials design® (CMD®) has been proven to be a very powerful tool for developing novel materials through obtaining relevant understanding of the basic principles underlying a system. Among others, realization of the switching mechanism in resistance random access memory (RRAM) devices has been an interesting field. Here, we propose a mechanism of resistive switching in RRAM based on the change in the electronic properties of the transition metal oxide (TMO) layer through the occurrence of rowed oxygen vacancies.