基于趋肤效应的含扁厚金属导体微带线严格电磁建模

R. Mejri, T. Aguili
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引用次数: 0

摘要

在大多数对微带电路的研究中,大多数研究者假设所研究的微带结构具有有限宽度但没有厚度的扁平金属导体。但实际上,这些类型的结构集成了不同厚度的金属铜导体。如果忽略这个厚度,微带结构的电学参数就会产生误差,从而影响有效介电常数、特性阻抗、电路的自适应、谐振频率等。考虑到该参数(微橡胶结构的金属厚度)的重要性,提出了基于集肤效应现象(实际上在高频下会出现集肤现象,电流仅在导体外围流动)的厚微橡胶线的严格电磁建模,以改进所研究的电模型,并确保所使用的分析方法的精度提高:波概念迭代过程。模拟数据与公布数据吻合较好,证明了模型的改进。
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Rigorous Electromagnetic Modeling of a Micro Strip Line Incorporating a Flat and Thick Metallic Conductor Based on the Skin Effect Phenomenon
In most studies of microstrip circuits, the majority of researchers assume that the microstrip structures studied have flat metallic conductors of finite widths but without thickness. But in reality these types of structures integrate metallic copper conductors of different thicknesses. If we neglect this thickness we introduce error in the electrical parameters of the microstrip structure, which affects the effective permittivity, the characteristic impedance, the adaptation of the circuit, the resonance frequency, etc. Given the importance of this parameter (thickness of the metal of micro rubon structures), rigorous electro-magnetic modeling of the thick micro rubon line based on the skin effect phenomenon (In fact at high frequency the skin effect phenomenon occurs and the current only flows on the periphery of the conductor) has been proposed to improve the studied electric model and ensure the increase in the precision of the analysis method used: Wave concept iterative process. The good agreement between the simulated and published data justifies the improvement of the model.
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