{"title":"VLSI设计中的技术可视化","authors":"P. Restle","doi":"10.1145/378239.378569","DOIUrl":null,"url":null,"abstract":"Visualization techniques were applied to several different types of VLSI design and simulation data. A number of different visualizations have been tried, with varying results. Examples include 3D visualization of voltage and currents from full-wave interconnect analysis, on-chip clock distribution networks, chip/package power supply noise analysis, wire congestion, chip layout imaging, and static circuit tuning. The goals, successes, and failures of these examples will be discussed, along with some unexpected benefits from our ability to easily see patterns in complex visualizations.","PeriodicalId":154316,"journal":{"name":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Technical visualizations in VLSI design\",\"authors\":\"P. Restle\",\"doi\":\"10.1145/378239.378569\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Visualization techniques were applied to several different types of VLSI design and simulation data. A number of different visualizations have been tried, with varying results. Examples include 3D visualization of voltage and currents from full-wave interconnect analysis, on-chip clock distribution networks, chip/package power supply noise analysis, wire congestion, chip layout imaging, and static circuit tuning. The goals, successes, and failures of these examples will be discussed, along with some unexpected benefits from our ability to easily see patterns in complex visualizations.\",\"PeriodicalId\":154316,\"journal\":{\"name\":\"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-06-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/378239.378569\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/378239.378569","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Visualization techniques were applied to several different types of VLSI design and simulation data. A number of different visualizations have been tried, with varying results. Examples include 3D visualization of voltage and currents from full-wave interconnect analysis, on-chip clock distribution networks, chip/package power supply noise analysis, wire congestion, chip layout imaging, and static circuit tuning. The goals, successes, and failures of these examples will be discussed, along with some unexpected benefits from our ability to easily see patterns in complex visualizations.