Automated Noise Parameter Measurement Using a New De-Embedding. Algorithm

I I I I I Many noise parameter test sets have been introduced during the past several years [ l]-[S]. The test set described in this paper emphasizes the features useful for automating this measurement. Specifically, the proposed test set utilizes a single digital input tuner; a mechanical tuner, which is inherently slow, is not required. This test set can also reference the measurement to the input of a transistor mounted on a carrier, measure noise parameters to high frequencies and be integrated inexpensively into a microwave test environment where a noise figure meter and vector network analyzer are present. The input tuner represents the only addition to this environment.