Ar, Kr和Xe的精密VUV激光光谱

I. Velchev, F. Brandi, W. Hogervorst, W. Ubachs
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引用次数: 0

摘要

结合脉冲染料放大(PDA)和谐波产生技术,我们在波长域58-115 nm产生傅里叶变换限制脉冲,允许高分辨率激光光谱研究。由于PDA运行在窄带连续波激光的频率上,因此很容易测量跃迁的绝对频率。第一个例子是在105nm的氩气中精确测量3p/sup 6/-3p/sup 5/4s'[1/2]/sub 1/共振。通过对B-X体系中I/sub - 2/-超细组分的饱和光谱在线记录,可以确定其绝对频率。我们得到了电离势的一个新值。此外,由于只需要相对测量,因此可以以更高的精度测量该跃迁上的跃迁同位素位移。研究氪和氙在不同激发水平下的同位素位移和超精细结构的工作正在进行中,再次使用VUV和XUV激光激发,目的是确定电离势的准确值。
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Precision VUV laser spectroscopy on Ar, Kr and Xe
With the combined techniques of pulsed-dye-amplification (PDA) and harmonic generation we generate Fourier-transform limited pulses in the wavelength domain 58-115 nm that allow for high resolution laser spectroscopic studies. Since the PDA runs at the frequency of a narrowband CW laser there is easy access to measure the absolute frequency of the transition. A first example is that of a precision measurement of the 3p/sup 6/-3p/sup 5/4s'[1/2]/sub 1/ resonance in argon at 105 nm. Based on the on-line recording of saturation spectroscopy of I/sub 2/-hyperfine components in the B-X system, the absolute frequency can be determined. We derive a new value for the ionization potential. Also the transition isotope shift on this transition can be measured, even with higher precision, since only relative measurements are required. Work is in progress to investigate isotope shifts and hyperfine structures in various excited levels of krypton and xenon, again with VUV and XUV laser excitation, with the aim of determining accurate values for the ionization potentials.
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