C. Scognamillo, A. P. Catalano, V. d’Alessandro, L. Codecasa, A. Castellazzi
{"title":"基于结构功能的双面冷却电源模块缺陷检测","authors":"C. Scognamillo, A. P. Catalano, V. d’Alessandro, L. Codecasa, A. Castellazzi","doi":"10.1109/prime55000.2022.9816814","DOIUrl":null,"url":null,"abstract":"This paper presents an approach based on structure functions aimed to the defect detection in state-of-the-art double-sided cooled power modules. The investigation is conducted by means of highly detailed 3-D finite-element method thermal simulations on the exact replica of a power module. Typical defects are emulated ad-hoc in the numerical environment: solder delamination, detached interconnections, and voids/bubbles in the thermal interface material. It is demonstrated that assigned defects give specific shapes to the structure functions; once these shapes are classified, the nature of the defects can be easily unraveled from experimental data.","PeriodicalId":142196,"journal":{"name":"2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Defect Detection in Double-Sided Cooled Power Modules by Structure Functions\",\"authors\":\"C. Scognamillo, A. P. Catalano, V. d’Alessandro, L. Codecasa, A. Castellazzi\",\"doi\":\"10.1109/prime55000.2022.9816814\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an approach based on structure functions aimed to the defect detection in state-of-the-art double-sided cooled power modules. The investigation is conducted by means of highly detailed 3-D finite-element method thermal simulations on the exact replica of a power module. Typical defects are emulated ad-hoc in the numerical environment: solder delamination, detached interconnections, and voids/bubbles in the thermal interface material. It is demonstrated that assigned defects give specific shapes to the structure functions; once these shapes are classified, the nature of the defects can be easily unraveled from experimental data.\",\"PeriodicalId\":142196,\"journal\":{\"name\":\"2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/prime55000.2022.9816814\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/prime55000.2022.9816814","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Defect Detection in Double-Sided Cooled Power Modules by Structure Functions
This paper presents an approach based on structure functions aimed to the defect detection in state-of-the-art double-sided cooled power modules. The investigation is conducted by means of highly detailed 3-D finite-element method thermal simulations on the exact replica of a power module. Typical defects are emulated ad-hoc in the numerical environment: solder delamination, detached interconnections, and voids/bubbles in the thermal interface material. It is demonstrated that assigned defects give specific shapes to the structure functions; once these shapes are classified, the nature of the defects can be easily unraveled from experimental data.