{"title":"用于DWDM应用的标准LC连接器的高功率耐久性研究。","authors":"Rakibul Islam Shabbir, Lin Ma, Zuyuan He","doi":"10.1109/OECC48412.2020.9273569","DOIUrl":null,"url":null,"abstract":"We investigated high power durability of standard LC connectors both with and without consideration of dust at about 18 W. Our results imply that monitoring output power variation is effective to protect connectors from damage.","PeriodicalId":433309,"journal":{"name":"2020 Opto-Electronics and Communications Conference (OECC)","volume":"292 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Investigation on High Power Durability of Standard LC Connectors for DWDM Application.\",\"authors\":\"Rakibul Islam Shabbir, Lin Ma, Zuyuan He\",\"doi\":\"10.1109/OECC48412.2020.9273569\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We investigated high power durability of standard LC connectors both with and without consideration of dust at about 18 W. Our results imply that monitoring output power variation is effective to protect connectors from damage.\",\"PeriodicalId\":433309,\"journal\":{\"name\":\"2020 Opto-Electronics and Communications Conference (OECC)\",\"volume\":\"292 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-10-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 Opto-Electronics and Communications Conference (OECC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OECC48412.2020.9273569\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Opto-Electronics and Communications Conference (OECC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OECC48412.2020.9273569","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation on High Power Durability of Standard LC Connectors for DWDM Application.
We investigated high power durability of standard LC connectors both with and without consideration of dust at about 18 W. Our results imply that monitoring output power variation is effective to protect connectors from damage.
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