共聚焦表面等离子体共振显微镜与瞳孔功能工程

Bei Zhang, Suejit Pechprasarn, M. Somekh
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引用次数: 0

摘要

表面等离子体显微技术作为一种具有巨大潜力的测量折射率局部变化的技术,一直在积极地发展。与其他研究人员一样,我们已经使用了各种干涉技术来证明该方法的潜力。所谓的V(z)响应给出了在样品上产生的SPs的指示性质。
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Confocal surface plasmon resonance microscopy with pupil function engineering
We have been actively developing surface plasmon (SP) microscopy as a technique which has great potential for measuring localized changes in refractive index. We have used various interference techniques1 to demonstrate the potential of the method as have other researchers2. The so called V(z) response gives an indication properties of the SPs generated on the sample.
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