{"title":"使用接收器和驱动程序重新配置的过程变化容忍片上通信","authors":"E. Nigussie, J. Plosila, J. Isoaho","doi":"10.1109/ISQED.2010.5450534","DOIUrl":null,"url":null,"abstract":"We present a process variation tolerance technique for current sensing on-chip links. Process variation affects the signal integrity of a current sensing receiver. As the amount of worst-case current variation is increasing in sub-100nm technologies, the conventional worst-case process variation assumption has a high power consumption cost. We propose adjusting currents at every power start-up of the system through receiver and driver reconfiguration when an error is detected. This makes the link adaptive to the effect of variations enabling continuous and reliable operation of the link. It also results in lower power consumption than the worst-case approach. An error detection scheme as well as a reconfiguration algorithm and methodology are developed. Furthermore, reconfiguration control and communication circuits are designed and simulated for a multilevel current sensing link. Depending on the detected error(s), the time it takes to adjust the currents and start the normal data transmission phase ranges from 2.66ns to 5.72ns. The proposed technique is area efficient for relatively wider links. For a 64-bits link the overhead is 4.67% silicon area and 2.63% wiring area. The circuits are designed and simulated in Cadence Analog Spectre using 65nm CMOS technology from STMicroelectronics.","PeriodicalId":369046,"journal":{"name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","volume":"91 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Process variation tolerant on-chip communication using receiver and driver reconfiguration\",\"authors\":\"E. Nigussie, J. Plosila, J. Isoaho\",\"doi\":\"10.1109/ISQED.2010.5450534\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a process variation tolerance technique for current sensing on-chip links. Process variation affects the signal integrity of a current sensing receiver. As the amount of worst-case current variation is increasing in sub-100nm technologies, the conventional worst-case process variation assumption has a high power consumption cost. We propose adjusting currents at every power start-up of the system through receiver and driver reconfiguration when an error is detected. This makes the link adaptive to the effect of variations enabling continuous and reliable operation of the link. It also results in lower power consumption than the worst-case approach. An error detection scheme as well as a reconfiguration algorithm and methodology are developed. Furthermore, reconfiguration control and communication circuits are designed and simulated for a multilevel current sensing link. Depending on the detected error(s), the time it takes to adjust the currents and start the normal data transmission phase ranges from 2.66ns to 5.72ns. The proposed technique is area efficient for relatively wider links. For a 64-bits link the overhead is 4.67% silicon area and 2.63% wiring area. The circuits are designed and simulated in Cadence Analog Spectre using 65nm CMOS technology from STMicroelectronics.\",\"PeriodicalId\":369046,\"journal\":{\"name\":\"2010 11th International Symposium on Quality Electronic Design (ISQED)\",\"volume\":\"91 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-03-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 11th International Symposium on Quality Electronic Design (ISQED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2010.5450534\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 11th International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2010.5450534","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
摘要
我们提出了一种电流传感片上链路的工艺变化容限技术。过程变化会影响电流传感接收器的信号完整性。随着亚100nm技术中最坏情况电流变化量的增加,传统的最坏情况工艺变化假设具有较高的功耗成本。我们建议在检测到错误时,通过重新配置接收器和驱动器来调整系统每次电源启动时的电流。这使得连杆能够适应变化的影响,从而使连杆能够连续可靠地运行。与最坏情况的方法相比,它的功耗也更低。提出了一种错误检测方案、重构算法和方法。在此基础上,设计并仿真了多电平电流传感链路的重构控制电路和通信电路。根据检测到的误差(s),调整电流并启动正常数据传输相位所需的时间范围为2.66ns至5.72ns。所提出的技术是面积效率相对较宽的链接。对于64位链路,开销是4.67%的硅面积和2.63%的布线面积。电路采用意法半导体的65nm CMOS技术在Cadence Analog Spectre中设计和仿真。
Process variation tolerant on-chip communication using receiver and driver reconfiguration
We present a process variation tolerance technique for current sensing on-chip links. Process variation affects the signal integrity of a current sensing receiver. As the amount of worst-case current variation is increasing in sub-100nm technologies, the conventional worst-case process variation assumption has a high power consumption cost. We propose adjusting currents at every power start-up of the system through receiver and driver reconfiguration when an error is detected. This makes the link adaptive to the effect of variations enabling continuous and reliable operation of the link. It also results in lower power consumption than the worst-case approach. An error detection scheme as well as a reconfiguration algorithm and methodology are developed. Furthermore, reconfiguration control and communication circuits are designed and simulated for a multilevel current sensing link. Depending on the detected error(s), the time it takes to adjust the currents and start the normal data transmission phase ranges from 2.66ns to 5.72ns. The proposed technique is area efficient for relatively wider links. For a 64-bits link the overhead is 4.67% silicon area and 2.63% wiring area. The circuits are designed and simulated in Cadence Analog Spectre using 65nm CMOS technology from STMicroelectronics.