用相位测量法测量小电容

[1990] Proceedings. The Twenty-Second Southeastern Symposium on System Theory Pub Date : 1990-03-11 DOI:10.1109/SSST.1990.138111

S. Natarajan, B.K. Herman

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引用次数: 14

摘要

提出了一种无需昂贵的测试装置即可测量小电容值的方法。该方法利用标准实验室设备进行相位测量。在测量电容的过程中，还要确定电容的损耗因子。这种方法适用于在宽频率范围内测量大范围的电容。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Measurement of small capacitances using phase measurement

A method for measuring small capacitance values without expensive test setups is presented. This method utilizes phase measurement with standard laboratory equipment. In the process of measuring the capacitance, the loss factor of the capacitance is also determined. This method lends itself to measuring a wide range of capacitances over a wide frequency range.<>

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[1990] Proceedings. The Twenty-Second Southeastern Symposium on System Theory

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