基于快速投影的电路电平验证方法

Chao Yan, M. Greenstreet
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引用次数: 13

摘要

随着VLSI制造技术发展到65nm及更小的特征尺寸,晶体管不再是理想的开关。这激发了使用连续模型验证数字电路的动机。最近,我们展示了如何使用基于投影的方法来执行这样的验证。然而,验证是缓慢的,需要近4个CPU天来验证一个9晶体管的开关触发器。在这里,我们描述了可达性算法的改进和软件架构的优化。这使计算时间减少了15倍,并大大减少了过度近似误差。通过这些更改,可以在几个小时内验证相同的开关触发器,使正式验证成为电路仿真的可行替代方案。
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Faster projection based methods for circuit level verification
As VLSI fabrication technology progresses to 65 nm feature sizes and smaller, transistors no longer operate as ideal switches. This motivates the verification of digital circuits using continuous models. Recently, we showed how such verification can be performed using projection based methods.However, the verification was slow, requiring nearly four CPU days to verify a nine-transistor toggle flip-flop. Here, we describe improvements to the reachability algorithms and optimizations of the software architecture. These produce a 15 x reduction in computation time and significant reductions in the overapproximation errors. With these changes, the same toggle flip-flop can be verified in a few hours, making formal verification a viable alternative to circuit simulation.
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