{"title":"石墨烯转移特性不对称的原因","authors":"Shouheng Xu, Qing Zhang","doi":"10.1109/IWJT.2010.5474966","DOIUrl":null,"url":null,"abstract":"Back-gated graphene field-effect transistor (FET) with Carrier mobility values over 8000 cm2/Vs is fabricated. Contact resistances and carrier motilities are extracted from an established model. We investigate the asymmetry in its transfer characteristics and attribute it to the differences in contact resistances modulated by the back gate voltages and distinct mobility of electrons and holes. The experimental results are analyzed quantitatively and the mechanisms are discussed.","PeriodicalId":205070,"journal":{"name":"2010 International Workshop on Junction Technology Extended Abstracts","volume":"110 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Causes of asymmetry in graphene transfer characteristics\",\"authors\":\"Shouheng Xu, Qing Zhang\",\"doi\":\"10.1109/IWJT.2010.5474966\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Back-gated graphene field-effect transistor (FET) with Carrier mobility values over 8000 cm2/Vs is fabricated. Contact resistances and carrier motilities are extracted from an established model. We investigate the asymmetry in its transfer characteristics and attribute it to the differences in contact resistances modulated by the back gate voltages and distinct mobility of electrons and holes. The experimental results are analyzed quantitatively and the mechanisms are discussed.\",\"PeriodicalId\":205070,\"journal\":{\"name\":\"2010 International Workshop on Junction Technology Extended Abstracts\",\"volume\":\"110 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International Workshop on Junction Technology Extended Abstracts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWJT.2010.5474966\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Workshop on Junction Technology Extended Abstracts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWJT.2010.5474966","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Causes of asymmetry in graphene transfer characteristics
Back-gated graphene field-effect transistor (FET) with Carrier mobility values over 8000 cm2/Vs is fabricated. Contact resistances and carrier motilities are extracted from an established model. We investigate the asymmetry in its transfer characteristics and attribute it to the differences in contact resistances modulated by the back gate voltages and distinct mobility of electrons and holes. The experimental results are analyzed quantitatively and the mechanisms are discussed.
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