{"title":"统计性能灵敏度——面向制造的CAD的一个有价值的度量","authors":"J. Purviance, M. Meehan","doi":"10.1109/MWSYM.1992.188132","DOIUrl":null,"url":null,"abstract":"The authors delineate the random and deterministic components of the manufacturing and design process. The model introduced shows the differences between statistical sensitivity and classic sensitivity. The statistical sensitivities are an extension of the classic sensitivities, applied to the general statistical outcome of the manufacturing process. The calculation procedure involves the efficient estimation of all the statistical sensitivities by using one Monte Carlo simulation. The calculation of these sensitivities and their application to a Salin and Key active filter are discussed.<<ETX>>","PeriodicalId":165665,"journal":{"name":"1992 IEEE Microwave Symposium Digest MTT-S","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Statistical performance sensitivity-a valuable measure for manufacturing oriented CAD\",\"authors\":\"J. Purviance, M. Meehan\",\"doi\":\"10.1109/MWSYM.1992.188132\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors delineate the random and deterministic components of the manufacturing and design process. The model introduced shows the differences between statistical sensitivity and classic sensitivity. The statistical sensitivities are an extension of the classic sensitivities, applied to the general statistical outcome of the manufacturing process. The calculation procedure involves the efficient estimation of all the statistical sensitivities by using one Monte Carlo simulation. The calculation of these sensitivities and their application to a Salin and Key active filter are discussed.<<ETX>>\",\"PeriodicalId\":165665,\"journal\":{\"name\":\"1992 IEEE Microwave Symposium Digest MTT-S\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1992 IEEE Microwave Symposium Digest MTT-S\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1992.188132\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1992 IEEE Microwave Symposium Digest MTT-S","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1992.188132","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Statistical performance sensitivity-a valuable measure for manufacturing oriented CAD
The authors delineate the random and deterministic components of the manufacturing and design process. The model introduced shows the differences between statistical sensitivity and classic sensitivity. The statistical sensitivities are an extension of the classic sensitivities, applied to the general statistical outcome of the manufacturing process. The calculation procedure involves the efficient estimation of all the statistical sensitivities by using one Monte Carlo simulation. The calculation of these sensitivities and their application to a Salin and Key active filter are discussed.<>