{"title":"利用聚焦光束系统的双轴材料表征","authors":"N. O’Gorman, M. Havrilla","doi":"10.1109/EMCEUROPE48519.2020.9245835","DOIUrl":null,"url":null,"abstract":"With the increase in complex materials used in modern society and the ease that they can be manufactured by implementing embedded structures, the need for methods to determine properties of more complex materials is in growing demand. This paper discusses the applications of a focus beam system to extract properties of biaxial materials and compares the results with other methods.","PeriodicalId":332251,"journal":{"name":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Biaxial Material Characterization Utilizing A Focus Beam System\",\"authors\":\"N. O’Gorman, M. Havrilla\",\"doi\":\"10.1109/EMCEUROPE48519.2020.9245835\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With the increase in complex materials used in modern society and the ease that they can be manufactured by implementing embedded structures, the need for methods to determine properties of more complex materials is in growing demand. This paper discusses the applications of a focus beam system to extract properties of biaxial materials and compares the results with other methods.\",\"PeriodicalId\":332251,\"journal\":{\"name\":\"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE\",\"volume\":\"95 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-09-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCEUROPE48519.2020.9245835\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE48519.2020.9245835","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Biaxial Material Characterization Utilizing A Focus Beam System
With the increase in complex materials used in modern society and the ease that they can be manufactured by implementing embedded structures, the need for methods to determine properties of more complex materials is in growing demand. This paper discusses the applications of a focus beam system to extract properties of biaxial materials and compares the results with other methods.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
