真实测量,虚拟仪器

M. Billaud, T. Zimmer, D. Geoffroy, Y. Danto, H. Effinger, W. Seifert, J. Martinez, F. Gomez
{"title":"真实测量,虚拟仪器","authors":"M. Billaud, T. Zimmer, D. Geoffroy, Y. Danto, H. Effinger, W. Seifert, J. Martinez, F. Gomez","doi":"10.1109/ICCDCS.2002.1004080","DOIUrl":null,"url":null,"abstract":"This paper presents the realisation of a remote lab on a European scale. The involved countries are France, Germany, and Spain. The architecture of the lab is described and the functionality has been tested. It concerns the instrumentation in the field of microelectronics. It has been applied to the characterisation of MOS transistors.","PeriodicalId":416680,"journal":{"name":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":"{\"title\":\"Real measures, virtual instruments\",\"authors\":\"M. Billaud, T. Zimmer, D. Geoffroy, Y. Danto, H. Effinger, W. Seifert, J. Martinez, F. Gomez\",\"doi\":\"10.1109/ICCDCS.2002.1004080\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the realisation of a remote lab on a European scale. The involved countries are France, Germany, and Spain. The architecture of the lab is described and the functionality has been tested. It concerns the instrumentation in the field of microelectronics. It has been applied to the characterisation of MOS transistors.\",\"PeriodicalId\":416680,\"journal\":{\"name\":\"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"20\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCDCS.2002.1004080\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCDCS.2002.1004080","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20

摘要

本文介绍了一个欧洲规模的远程实验室的实现。涉及的国家是法国、德国和西班牙。描述了实验室的体系结构,并对其功能进行了测试。它涉及微电子领域的仪器仪表。它已被应用于MOS晶体管的表征。
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Real measures, virtual instruments
This paper presents the realisation of a remote lab on a European scale. The involved countries are France, Germany, and Spain. The architecture of the lab is described and the functionality has been tested. It concerns the instrumentation in the field of microelectronics. It has been applied to the characterisation of MOS transistors.
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