{"title":"银电极在铋基陶瓷中的界面扩散及其对介电性能的影响","authors":"Xiukai Cai, Xiaobo Sun, Lufeng Pang","doi":"10.1109/ISAF.2017.8000202","DOIUrl":null,"url":null,"abstract":"Co-fired multiplayer ceramic capacitors sintered at lower temperatures than the melting point of silver electrode, are required to have excellent reliabilities. So the interface behaviors between bismuth-based dielectrics and silver metallic electrode, have been attracted wide attentions. Now it was found that the bismuth-based dielectric ceramics show deteriorated properties towards higher silver-fired temperatures. The silver's distributions in the vicinity of the interface layer were quantitatively determined by Scanning Electron Microscopy with Energy Dispersive Spectroscopy, it is duo to the metallic electrode silver to be diffused into the dielectric layer, that go bad the dielectric properties.","PeriodicalId":421889,"journal":{"name":"2017 Joint IEEE International Symposium on the Applications of Ferroelectric (ISAF)/International Workshop on Acoustic Transduction Materials and Devices (IWATMD)/Piezoresponse Force Microscopy (PFM)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Interface diffusion of silver electrode into bismuth-based ceramics and its effects on the dielectric properties\",\"authors\":\"Xiukai Cai, Xiaobo Sun, Lufeng Pang\",\"doi\":\"10.1109/ISAF.2017.8000202\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Co-fired multiplayer ceramic capacitors sintered at lower temperatures than the melting point of silver electrode, are required to have excellent reliabilities. So the interface behaviors between bismuth-based dielectrics and silver metallic electrode, have been attracted wide attentions. Now it was found that the bismuth-based dielectric ceramics show deteriorated properties towards higher silver-fired temperatures. The silver's distributions in the vicinity of the interface layer were quantitatively determined by Scanning Electron Microscopy with Energy Dispersive Spectroscopy, it is duo to the metallic electrode silver to be diffused into the dielectric layer, that go bad the dielectric properties.\",\"PeriodicalId\":421889,\"journal\":{\"name\":\"2017 Joint IEEE International Symposium on the Applications of Ferroelectric (ISAF)/International Workshop on Acoustic Transduction Materials and Devices (IWATMD)/Piezoresponse Force Microscopy (PFM)\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 Joint IEEE International Symposium on the Applications of Ferroelectric (ISAF)/International Workshop on Acoustic Transduction Materials and Devices (IWATMD)/Piezoresponse Force Microscopy (PFM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAF.2017.8000202\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Joint IEEE International Symposium on the Applications of Ferroelectric (ISAF)/International Workshop on Acoustic Transduction Materials and Devices (IWATMD)/Piezoresponse Force Microscopy (PFM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.2017.8000202","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Interface diffusion of silver electrode into bismuth-based ceramics and its effects on the dielectric properties
Co-fired multiplayer ceramic capacitors sintered at lower temperatures than the melting point of silver electrode, are required to have excellent reliabilities. So the interface behaviors between bismuth-based dielectrics and silver metallic electrode, have been attracted wide attentions. Now it was found that the bismuth-based dielectric ceramics show deteriorated properties towards higher silver-fired temperatures. The silver's distributions in the vicinity of the interface layer were quantitatively determined by Scanning Electron Microscopy with Energy Dispersive Spectroscopy, it is duo to the metallic electrode silver to be diffused into the dielectric layer, that go bad the dielectric properties.