一种在高密度设计中执行SET故障注入的方法和自动化工具

2013 25th International Conference on Microelectronics (ICM) Pub Date : 2013-12-01 DOI:10.1109/ICM.2013.6734986

W. Mansour, R. Velazco, R. Ayoubi, H. Ziade, W. El Falou

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引用次数: 14

摘要

提出了一种全自动故障注入方法。它可以处理由高能粒子冲击引起的瞬态故障，并且可以在设计阶段早期应用于任何可以使用寄存器传递电平模型的电路。该方法在人工神经网络基准测试中的应用结果表明，该方法能够准确预测由辐射环境引起的暂态故障的误差率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A method and an automated tool to perform SET fault-injection on HDL-based designs

A fully automated fault-injection method is presented. It deals with transient faults resulting from the impact of energetic particles and it can be applied early at design phase, on any circuit for which the register transfer level model is available. Results issued from its application to an Artificial Neural Network benchmark application put in evidence the accuracy of the studied method to predict error rates due to transient faults generated by the radiation environment.

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2013 25th International Conference on Microelectronics (ICM)

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