激光加工Sn-Ag-Cu-Ni焊料/Cu接头的界面反应

H. Nishikawa, Ryo Matsunobu
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摘要

随着电子产品的小型化和热敏性电子元件的使用,传统的回流焊往往存在困难。作为一种替代焊接工艺,激光回流工艺最近被提出,并且由于其独特的性能,如局部和非接触加热,温度的快速上升和下降,以及易于自动化和机器人化,激光工艺已被引入工业实际应用。然而,对激光加热接头的基本现象和性能的讨论有限。本研究采用Sn-3.0质量%Ag-0.5质量% Cu钎料和Sn-3.0质量%Ag-0.5 Cu-0.1 ni钎料球,其直径为0.76 mm。采用厚度为35 μ m,直径为0.6 mm的铜衬垫作为衬底。研究了添加Ni钎料与激光加热的Cu钎料之间的界面反应以及加热和等温时效后的焊缝组织。在加热条件下,在界面处形成了一层很薄的IMC层,在激光处理的情况下,IMC中含有Ni元素。结果表明,在Sn- ag -Cu- ni钎料中,等温时效过程中Cu衬垫与Cu6 Sn5层之间的Cu3 Sn层的生长受到抑制。
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Interfacial reaction of Sn-Ag-Cu-Ni solder/Cu joints by laser process
With the miniaturization of electronic productions and the use of heat sensitive electronic components,the traditional reflow soldering often has difficulties. As an alternativesoldering process, a laser reflow process has been recently proposed and a laser process has been introduced into the industry for practical use because of its unique properties such as localized and noncontact heating, rapid rise and fall in temperature, and ease of automation and robotization. However, there has been limited discussion for the basic phenomena and performance of the joints heated by this laser process. In this study, Sn-3.0 mass%Ag-0.5 mass% Cu solder and Sn-3.0 mass%Ag-0.5 Cu-0.1Ni solder balls with a diameter of 0.76 mm were used. Cu pads that had a thickness of 35 $\mu$m and a diameter of 0.6 mm and were used as the substrate. The interfacial reaction between a Ni added solder and a Cu pad heated by laser process and the microstructure of soldered joint after heating and after isothermal aging was investigated. In the as-heated condition, a quite thin IMC layer was formed at the interface and Ni element was included in the IMC in the case of the laser process. It was found that the growth of Cu3 Sn layer between the Cu pad and Cu6 Sn5 layer during isothermal aging was suppressed in the case of Sn-Ag-Cu-Ni solder.
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