{"title":"具有最佳性能的六端口反射计","authors":"S. Yeo, K.H. Lee","doi":"10.1109/IMTC.1989.36914","DOIUrl":null,"url":null,"abstract":"The authors describe a six-port reflectometer consisting of a symmetrical five-port waveguide junction and a directional coupler. Theoretical and experimental results show that such an instrument can yield optimum measurement performance over about 80% of the waveguide bandwidth. Measurements taken using the prototype reflectometer indicate that accuracies of +or-0.005 in magnitude and +or-0.5 degrees in phase are obtainable.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Six-port reflectometer capable of optimum performance\",\"authors\":\"S. Yeo, K.H. Lee\",\"doi\":\"10.1109/IMTC.1989.36914\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors describe a six-port reflectometer consisting of a symmetrical five-port waveguide junction and a directional coupler. Theoretical and experimental results show that such an instrument can yield optimum measurement performance over about 80% of the waveguide bandwidth. Measurements taken using the prototype reflectometer indicate that accuracies of +or-0.005 in magnitude and +or-0.5 degrees in phase are obtainable.<<ETX>>\",\"PeriodicalId\":298343,\"journal\":{\"name\":\"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-04-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1989.36914\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1989.36914","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Six-port reflectometer capable of optimum performance
The authors describe a six-port reflectometer consisting of a symmetrical five-port waveguide junction and a directional coupler. Theoretical and experimental results show that such an instrument can yield optimum measurement performance over about 80% of the waveguide bandwidth. Measurements taken using the prototype reflectometer indicate that accuracies of +or-0.005 in magnitude and +or-0.5 degrees in phase are obtainable.<>
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