提取所需反射以补偿微带夹具的密封连接器

H. Stinehelfer
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引用次数: 0

摘要

对带密封连接器的微带测试夹具进行了测试,并将其转换为时域,以显示每个连接器处的反射。MAMA程序使用新型hp8510c分析仪和PC-486控制器进行测量。这是一个实验性的微带线在一个空盒子外壳。然后使用电容演示文件通过在实验中“注入”电容反射来修改连接器。结果给出了相同的结果,如果一个实际的电容已经添加到测试夹具连接器。
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"Extracting the Required Reflection to Compensate the Sealed Connector of a Microstrip Fixture"
The microstrip test fixture with sealed connectors was tested and converted to the time domain to reveal the reflections at each connector. The MAMA program was used to make the measurements using the new hp8510c analyzer and the PC-486 controller. This is an experimental micro strip line in an empty box housing. A capacitive demonstration file was then used to modify the connectors by "injecting" into the experiment a capacitive reflection. The results gave the same result as if an actual capacitance had been added to the test fixture connector.
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