Jian Liu, Lijie Zhang, Xin Wang, Lin Lin, Zitao Shi, Albert Z. H. Wang, Ru Huang, Gary Zhang, Shi-Jie Wen, R. Wong
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We report design and analysis of new nano crossbar based nano phase switching electrostatic discharge (ESD) protection structures. Measurements confirm ESD protection featuring fast response of 100pS, ultra low leakage Ileak∼0.11pA, varying trigger voltage (Vt1) and good ESD protection voltage ratio (ESDV)>230V/µm2. This non-traditional nano-crossbar ESD protection can be a potential solution for RF and mixed-signal ICs.