60 GHz微带校准与验证标准的制定

34th ARFTG Conference Digest Pub Date : 1989-11-01 DOI:10.1109/ARFTG.1989.323953

W. Oldfield

{"title":"60 GHz微带校准与验证标准的制定","authors":"W. Oldfield","doi":"10.1109/ARFTG.1989.323953","DOIUrl":null,"url":null,"abstract":"This paper discusses the development of microstrip standards for calibration and accuracy verification. Calibration standards for both OPEN-SHORT-LOAD and LRL are explored. The standards were developed for use in the newly developed Wiltron microstrip test fixture. Test data to confirm the quality of the calibrations is presented. Practical techniques for making multiport microstrip measurements without the need of special test fixtures are discussed.","PeriodicalId":153615,"journal":{"name":"34th ARFTG Conference Digest","volume":"125 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Development of Calibration and Verification Standards in Microstrip to 60 GHz\",\"authors\":\"W. Oldfield\",\"doi\":\"10.1109/ARFTG.1989.323953\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the development of microstrip standards for calibration and accuracy verification. Calibration standards for both OPEN-SHORT-LOAD and LRL are explored. The standards were developed for use in the newly developed Wiltron microstrip test fixture. Test data to confirm the quality of the calibrations is presented. Practical techniques for making multiport microstrip measurements without the need of special test fixtures are discussed.\",\"PeriodicalId\":153615,\"journal\":{\"name\":\"34th ARFTG Conference Digest\",\"volume\":\"125 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"34th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1989.323953\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"34th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1989.323953","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

本文讨论了用于校准和精度验证的微带标准的发展。探讨了开-短负荷和LRL的标定标准。这些标准是为新开发的Wiltron微带测试夹具而开发的。给出了验证校准质量的测试数据。讨论了在不需要特殊测试夹具的情况下进行多端口微带测量的实用技术。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Development of Calibration and Verification Standards in Microstrip to 60 GHz

This paper discusses the development of microstrip standards for calibration and accuracy verification. Calibration standards for both OPEN-SHORT-LOAD and LRL are explored. The standards were developed for use in the newly developed Wiltron microstrip test fixture. Test data to confirm the quality of the calibrations is presented. Practical techniques for making multiport microstrip measurements without the need of special test fixtures are discussed.

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34th ARFTG Conference Digest

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