N. Jovanovic, D. Mawet, J. Delorme, C. Bond, S. Cetre, D. Echeverri, J. Wallace, R. Bartos, S. Lilley, S. Ragland, G. Ruane, P. Wizinowich, M. Chun, Ji Wang, Jason Wang, Michael P. Fitzgerald, Jacklyn Pezzato, E. Martin, E. Wetherell, E. Wang, S. Jacobson, Eric A. Warmbier, C. Lockhart, D. Hall
{"title":"凯克行星成像仪和表征仪:为未来的超大望远镜展示先进的系外行星表征技术(会议报告)","authors":"N. Jovanovic, D. Mawet, J. Delorme, C. Bond, S. Cetre, D. Echeverri, J. Wallace, R. Bartos, S. Lilley, S. Ragland, G. Ruane, P. Wizinowich, M. Chun, Ji Wang, Jason Wang, Michael P. Fitzgerald, Jacklyn Pezzato, E. Martin, E. Wetherell, E. Wang, S. Jacobson, Eric A. Warmbier, C. Lockhart, D. Hall","doi":"10.1117/12.2529330","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":421717,"journal":{"name":"Techniques and Instrumentation for Detection of Exoplanets IX","volume":"118 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"The Keck Planet Imager and Characterizer: demonstrating advanced exoplanet characterization techniques for future extremely large telescopes (Conference Presentation)\",\"authors\":\"N. Jovanovic, D. Mawet, J. Delorme, C. Bond, S. Cetre, D. Echeverri, J. Wallace, R. Bartos, S. Lilley, S. Ragland, G. Ruane, P. Wizinowich, M. Chun, Ji Wang, Jason Wang, Michael P. Fitzgerald, Jacklyn Pezzato, E. Martin, E. Wetherell, E. Wang, S. Jacobson, Eric A. Warmbier, C. Lockhart, D. Hall\",\"doi\":\"10.1117/12.2529330\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":421717,\"journal\":{\"name\":\"Techniques and Instrumentation for Detection of Exoplanets IX\",\"volume\":\"118 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Techniques and Instrumentation for Detection of Exoplanets IX\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2529330\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Techniques and Instrumentation for Detection of Exoplanets IX","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2529330","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Keck Planet Imager and Characterizer: demonstrating advanced exoplanet characterization techniques for future extremely large telescopes (Conference Presentation)