Magnetic field sensing using laser written birefringent scattering medium

We demonstrate a polarization analyser based on processing of speckle patterns generated by a scattering medium. Each speckle pattern at a given wavelength and polarization state is unique and deterministic, and thus the polarization angle alters the speckle pattern motif. The polarization state of a given input light is obtained using reconstructive linear algebra methods. The system consists of a femtosecond laser written scattering chip and a CMOS sensor and contains no moving parts, making the proposed solution is low-cost and compact. The linear polarization angle was accurately reconstructed over a 0-20° test range, with 6 arcminutes (1/10° ) standard error. To demonstrate an application as a polarimeter, we used the system to measure Faraday rotation in a SF59 lead silicate glass within an electromagnet. The magnetic field was successfully traced by determining the induced changes in the input beam’s linear polarization angle in the range 0-80 mT with 10 mT standard error.