{"title":"长记性的好处","authors":"M. Schumacher","doi":"10.1109/IMTC.1989.36841","DOIUrl":null,"url":null,"abstract":"A major figure of merit in digital scopes is the size of the acquisition memory. The author discusses the importance of this specification by examining a series of advantages directly traceable to long memories. Long records provide higher sampling rates, higher single-shot bandwidth, vastly reduced aliasing effects, substitution for inaccurate glitch detectors, improved signal-to-noise ratios, wide dynamic range in the frequency domain, and high signal processing accuracy. The author discusses sampling-rate variation, acquisition of long-duration events, glitch detection, accuracy of pulse waveform measurements, and waveform reconstruction and distortion.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Advantages of long memories\",\"authors\":\"M. Schumacher\",\"doi\":\"10.1109/IMTC.1989.36841\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A major figure of merit in digital scopes is the size of the acquisition memory. The author discusses the importance of this specification by examining a series of advantages directly traceable to long memories. Long records provide higher sampling rates, higher single-shot bandwidth, vastly reduced aliasing effects, substitution for inaccurate glitch detectors, improved signal-to-noise ratios, wide dynamic range in the frequency domain, and high signal processing accuracy. The author discusses sampling-rate variation, acquisition of long-duration events, glitch detection, accuracy of pulse waveform measurements, and waveform reconstruction and distortion.<<ETX>>\",\"PeriodicalId\":298343,\"journal\":{\"name\":\"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-04-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1989.36841\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1989.36841","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A major figure of merit in digital scopes is the size of the acquisition memory. The author discusses the importance of this specification by examining a series of advantages directly traceable to long memories. Long records provide higher sampling rates, higher single-shot bandwidth, vastly reduced aliasing effects, substitution for inaccurate glitch detectors, improved signal-to-noise ratios, wide dynamic range in the frequency domain, and high signal processing accuracy. The author discusses sampling-rate variation, acquisition of long-duration events, glitch detection, accuracy of pulse waveform measurements, and waveform reconstruction and distortion.<>