T. Steinecke, M. Unger, Stanislav Scheier, S. Frei, Josip Bačmaga, A. Barić
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引用次数: 2
摘要
虽然微控制器通常与发生在完整装备和安装的电子控制单元上的ESD事件分离得很好,但特殊配置会使一些微控制器暴露在这些系统ESD事件中。在bis IC EMC测试规范[1]中,引用了几个系统级干扰测试。其中一种是根据国际标准ISO 10506[2]进行的无电系统esd测试。汽车公司要求微控制器和其他ic能够承受直接或通过分立保护元件施加在ic引脚上的6 kV系统esd应力。本文介绍了65纳米CMOS 32位微控制器在暴露于标准系统ESD脉冲时的经验,该微控制器包含一个外部ESD保护滤波器。虽然没有预料到,但离散SMD保护电容器在暴露于几个ESD事件后会退化甚至出现短路。
System-ESD validation of a microcontroller with external RC-filter
Although microcontrollers are generally well separated from ESD events happening on a fully equipped and mounted electronic control unit, special configurations expose some microcontrollers to these system-ESD events. In the BISS IC EMC Test Specification [1], several system-level disturbance tests are referenced. One of them is the unpowered system-ESD test according to the international standard ISO 10506 [2]. Automotive companies request that microcontrollers and other ICs shall withstand e.g. 6 kV system-ESD stress applied to IC-pins either directly or via discrete protection components. This paper describes the experience made with a 65 nm CMOS 32-bit microcontroller including an external ESD protection filter when exposed to normative system-ESD pulses. Although not expected, discrete SMD protection capacitors degraded or even showed short-circuits after being exposed to several ESD events.