带有外部rc滤波器的微控制器的系统esd验证

T. Steinecke, M. Unger, Stanislav Scheier, S. Frei, Josip Bačmaga, A. Barić
{"title":"带有外部rc滤波器的微控制器的系统esd验证","authors":"T. Steinecke, M. Unger, Stanislav Scheier, S. Frei, Josip Bačmaga, A. Barić","doi":"10.1109/EMCCOMPO.2013.6735200","DOIUrl":null,"url":null,"abstract":"Although microcontrollers are generally well separated from ESD events happening on a fully equipped and mounted electronic control unit, special configurations expose some microcontrollers to these system-ESD events. In the BISS IC EMC Test Specification [1], several system-level disturbance tests are referenced. One of them is the unpowered system-ESD test according to the international standard ISO 10506 [2]. Automotive companies request that microcontrollers and other ICs shall withstand e.g. 6 kV system-ESD stress applied to IC-pins either directly or via discrete protection components. This paper describes the experience made with a 65 nm CMOS 32-bit microcontroller including an external ESD protection filter when exposed to normative system-ESD pulses. Although not expected, discrete SMD protection capacitors degraded or even showed short-circuits after being exposed to several ESD events.","PeriodicalId":302757,"journal":{"name":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"118 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"System-ESD validation of a microcontroller with external RC-filter\",\"authors\":\"T. Steinecke, M. Unger, Stanislav Scheier, S. Frei, Josip Bačmaga, A. Barić\",\"doi\":\"10.1109/EMCCOMPO.2013.6735200\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Although microcontrollers are generally well separated from ESD events happening on a fully equipped and mounted electronic control unit, special configurations expose some microcontrollers to these system-ESD events. In the BISS IC EMC Test Specification [1], several system-level disturbance tests are referenced. One of them is the unpowered system-ESD test according to the international standard ISO 10506 [2]. Automotive companies request that microcontrollers and other ICs shall withstand e.g. 6 kV system-ESD stress applied to IC-pins either directly or via discrete protection components. This paper describes the experience made with a 65 nm CMOS 32-bit microcontroller including an external ESD protection filter when exposed to normative system-ESD pulses. Although not expected, discrete SMD protection capacitors degraded or even showed short-circuits after being exposed to several ESD events.\",\"PeriodicalId\":302757,\"journal\":{\"name\":\"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"volume\":\"118 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCCOMPO.2013.6735200\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCOMPO.2013.6735200","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

虽然微控制器通常与发生在完整装备和安装的电子控制单元上的ESD事件分离得很好,但特殊配置会使一些微控制器暴露在这些系统ESD事件中。在bis IC EMC测试规范[1]中,引用了几个系统级干扰测试。其中一种是根据国际标准ISO 10506[2]进行的无电系统esd测试。汽车公司要求微控制器和其他ic能够承受直接或通过分立保护元件施加在ic引脚上的6 kV系统esd应力。本文介绍了65纳米CMOS 32位微控制器在暴露于标准系统ESD脉冲时的经验,该微控制器包含一个外部ESD保护滤波器。虽然没有预料到,但离散SMD保护电容器在暴露于几个ESD事件后会退化甚至出现短路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
System-ESD validation of a microcontroller with external RC-filter
Although microcontrollers are generally well separated from ESD events happening on a fully equipped and mounted electronic control unit, special configurations expose some microcontrollers to these system-ESD events. In the BISS IC EMC Test Specification [1], several system-level disturbance tests are referenced. One of them is the unpowered system-ESD test according to the international standard ISO 10506 [2]. Automotive companies request that microcontrollers and other ICs shall withstand e.g. 6 kV system-ESD stress applied to IC-pins either directly or via discrete protection components. This paper describes the experience made with a 65 nm CMOS 32-bit microcontroller including an external ESD protection filter when exposed to normative system-ESD pulses. Although not expected, discrete SMD protection capacitors degraded or even showed short-circuits after being exposed to several ESD events.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Characterization of conducted emission at high frequency under different temperature Signal integrity and EMC performance enhancement using 3D integrated circuits - A case study EMC immunity of integrated smart power transistors in a non-50Ω environment Active magnetic field canceling system Extraction of deterministic and random LSI noise models with the printed reverberation board
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1