Jaclyn Singh, F. Kiamilev, Miguel Hernandez, Tianne L. Lassiter, Alexis Deputy
{"title":"红外LED场景投影仪封闭电子系统的小批量制造和每周旋转测试","authors":"Jaclyn Singh, F. Kiamilev, Miguel Hernandez, Tianne L. Lassiter, Alexis Deputy","doi":"10.1109/RAPID49481.2020.9195691","DOIUrl":null,"url":null,"abstract":"Developing Infrared Scene Projectors (IRSPs) requires consistent performance from the Close Support Electronics (CSE) used to drive the IRSP systems. This paper highlights the small-batch production and rotational testing of these CSEs, which provides a measure of consistency and quality assurance across multiple systems.","PeriodicalId":220244,"journal":{"name":"2020 IEEE Research and Applications of Photonics in Defense Conference (RAPID)","volume":"58 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Small Batch Fabrication and Weekly Rotational Testing of Closed System Electronics for Infrared LED Scene Projectors\",\"authors\":\"Jaclyn Singh, F. Kiamilev, Miguel Hernandez, Tianne L. Lassiter, Alexis Deputy\",\"doi\":\"10.1109/RAPID49481.2020.9195691\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Developing Infrared Scene Projectors (IRSPs) requires consistent performance from the Close Support Electronics (CSE) used to drive the IRSP systems. This paper highlights the small-batch production and rotational testing of these CSEs, which provides a measure of consistency and quality assurance across multiple systems.\",\"PeriodicalId\":220244,\"journal\":{\"name\":\"2020 IEEE Research and Applications of Photonics in Defense Conference (RAPID)\",\"volume\":\"58 5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE Research and Applications of Photonics in Defense Conference (RAPID)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAPID49481.2020.9195691\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Research and Applications of Photonics in Defense Conference (RAPID)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAPID49481.2020.9195691","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Small Batch Fabrication and Weekly Rotational Testing of Closed System Electronics for Infrared LED Scene Projectors
Developing Infrared Scene Projectors (IRSPs) requires consistent performance from the Close Support Electronics (CSE) used to drive the IRSP systems. This paper highlights the small-batch production and rotational testing of these CSEs, which provides a measure of consistency and quality assurance across multiple systems.
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