微控制器进行了软件级效应的电磁干扰模型构建

Shih-Yi Yuan
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引用次数: 5

摘要

提出了一种考虑软件效应的微控制器(μC)传导电磁干扰(cEMI)模型建立方法。由于嵌入式系统设计技术的快速发展,软件现在几乎能够控制电子模块的所有功能,这意味着软件实际上可以影响目标模块的EMI特性。因此,软件级电磁干扰模型对于电子模块是必不可少的。由于知识产权(IP)的考虑,IC设计人员很少向EMI建模师透露其IC产品的内部架构细节。由于内部模块的行为是未知的,这使得EMI建模非常困难。提出了一种μC的块盒cEMI建模方法。这个概念是基于一组块盒脉冲响应(BBIR)函数。BBIR建模方法仅基于测量信息,将目标视为一个块盒。在建立模型后,可以估计具有相同μC的新测试板(或模块)的cEMI行为。通过实例验证了该模型的正确性。实验结果表明,该方法可以估计不同机器代码的cEMI行为。估计结果在时域和频域均与实测结果吻合较好。结果还表明,μC在不同机器码下的内部阻抗差异很大。
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A microcontrller conducted EMI model building for software-level effect
This paper proposes a model building process for conducted electromagnetic interference (cEMI) model of microcontroller (μC) considering software effect. Due to the fast advances of embedded system design technologies, software now is capable of controlling nearly all the features of electronic modules, which means software can actually affect EMI characteristics of target modules. Thus, a software-level EMI model is essential for electronic modules. Due to intellectual property (IP) considerations, IC designers seldom expose the internal architecture details of their IC products to EMI modelers. Because the internal module behaviors are unknown, it makes EMI modeling very difficult. This paper proposes a block-box cEMI modeling procedure for μC. The concept is based on a set of block-box impulse response (BBIR) functions. BBIR modeling method is based only on measurement information and treats the target as a block-box. After the model building process, the cEMI behavior of a new testing boards (or modules) with the same μC can be estimated. This model is verified by a case study. From the experiment results, it shows that the proposed method can estimate different machine code cEMI behaviors. The estimated result is in good accordance with the measurements both in time-domain and frequency-domain. The results also shows the internal impedances of a μC are quite different among machine codes executed by the μC.
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