基于cntfet的sram位单元在阈值供电电压下工作的挑战与解决方案

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Iet Circuits Devices & Systems Pub Date : 2022-08-15 DOI:10.1049/cds2.12126
Salimeh Shahrabadi
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引用次数: 0

摘要

近年来,对不同电源电压下的SRAM位单元进行了研究;高于、接近或低于阈值电压。据笔者所知,它们都没有在阈值电源电压下讨论适当的亚阈值操作和纳/皮功耗。因此,本文决定研究在V D D ${\mathbf{V}}_{\mathbf{D}\mathbf{D}}$ = V处设计的挑战和解决方案th ${\mathbf{V}}_{\mathbf{t}\mathbf{h}}$,因为这个电压会导致更低的功耗。本研究采用功率门控技术调节V D D ${\mathbf{V}}_{\mathbf{D}\mathbf{D}}$对V t的影响h ${\mathbf{V}}_{\mathbf{t}\mathbf{h}}$,并利用输出逆变器将逻辑1设置为V D D ${\mathbf{V}}_{\mathbf{D}\mathbf{D}}$。虽然“功率门控”和“输出逆变器”在其他工作中被使用,但本研究对它们提出了具体的观点。事实上,功率门控技术在V t上调节V D D ${\mathbf{V}}_{\mathbf{D}\mathbf{D}}$的能力h ${\mathbf{V}}_{\mathbf{t}\mathbf{h}}$在bitcell操作中没有任何不稳定性,以及,在读路径中使用输出逆变器将Logic-1设置为V D D ${\mathbf{V}}_{\mathbf{D}\mathbf{D}}$。它还提出SNM%作为一个有用的价值数字。这项研究的目的不是为bitcell提供新的电路,而是研究在“V D D = V t h”下工作的挑战和解决方案${\mathbf{V}}_{\mathbf{D}\mathbf{D}}={\mathbf{V}}_{\mathbf{t}\mathbf{h}}$ ',这些解决方案可以产生最优的位元。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Challenges and solutions of working under threshold supply-voltage, for CNTFET-based SRAM-bitcell

Recently, several studies were done on SRAM bitcells at different supply-voltages; upper, near or lower to threshold voltage. To the best of the author's knowledge, none of them discussed at threshold supply-voltage with proper subthreshold operations and Nano/Pico power-dissipations, hence this paper decides to investigate challenges and solutions of designing at V D D ${\mathbf{V}}_{\mathbf{D}\mathbf{D}}$  =  V t h ${\mathbf{V}}_{\mathbf{t}\mathbf{h}}$ , because this voltage will lead to having lower power consumptions. This research applies power-gating technique to adjust V D D ${\mathbf{V}}_{\mathbf{D}\mathbf{D}}$ on V t h ${\mathbf{V}}_{\mathbf{t}\mathbf{h}}$ , and also utilises output-inverter to set Logic 1 at V D D ${\mathbf{V}}_{\mathbf{D}\mathbf{D}}$ . Although ‘power-gating’ and ‘output-inverter’ were used in other works, this study renders specific points about them. In fact, the ability of power-gating technique in adjusting V D D ${\mathbf{V}}_{\mathbf{D}\mathbf{D}}$ on V t h ${\mathbf{V}}_{\mathbf{t}\mathbf{h}}$ without any instabilities in bitcell operation was not reported before, as well as, the idea of employing output-inverter in read path for setting Logic-1 at V D D ${\mathbf{V}}_{\mathbf{D}\mathbf{D}}$ . It also proposed SNM% as a useful figure-of-merit. The goal of this study is not to present new circuits for bitcell, but is to investigate challenges and solutions of working under ‘ V D D = V t h ${\mathbf{V}}_{\mathbf{D}\mathbf{D}}={\mathbf{V}}_{\mathbf{t}\mathbf{h}}$ ’ which these solutions can lead to having an optimum bitcell.

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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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