{"title":"故障模拟基础","authors":"J. Seaton","doi":"10.1109/ASIC.1989.123161","DOIUrl":null,"url":null,"abstract":"A description is given of the principles of fault simulation, fault modeling techniques and the economic benefits of fault simulation. The principles of fault simulation are discussed, including serial, parallel, and concurrent fault simulation algorithms. Digital faults, fault coverage, and fault mechanisms typically found in digital circuits are described. The tradeoffs of fault placement, fault collapsing algorithms, and the ability to discover different physical defects through fault simulation are discussed. Economic benefits are shown through empirical examples and through correlating fault coverage to average defect levels resulting after manufacturing test.<<ETX>>","PeriodicalId":245997,"journal":{"name":"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,","volume":"152 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fault simulation basics\",\"authors\":\"J. Seaton\",\"doi\":\"10.1109/ASIC.1989.123161\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A description is given of the principles of fault simulation, fault modeling techniques and the economic benefits of fault simulation. The principles of fault simulation are discussed, including serial, parallel, and concurrent fault simulation algorithms. Digital faults, fault coverage, and fault mechanisms typically found in digital circuits are described. The tradeoffs of fault placement, fault collapsing algorithms, and the ability to discover different physical defects through fault simulation are discussed. Economic benefits are shown through empirical examples and through correlating fault coverage to average defect levels resulting after manufacturing test.<<ETX>>\",\"PeriodicalId\":245997,\"journal\":{\"name\":\"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,\",\"volume\":\"152 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASIC.1989.123161\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1989.123161","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A description is given of the principles of fault simulation, fault modeling techniques and the economic benefits of fault simulation. The principles of fault simulation are discussed, including serial, parallel, and concurrent fault simulation algorithms. Digital faults, fault coverage, and fault mechanisms typically found in digital circuits are described. The tradeoffs of fault placement, fault collapsing algorithms, and the ability to discover different physical defects through fault simulation are discussed. Economic benefits are shown through empirical examples and through correlating fault coverage to average defect levels resulting after manufacturing test.<>