侧敏合成双采样X控制图

J. Malela‐Majika, E. Rapoo
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引用次数: 6

摘要

本文在修正侧敏(RSS)和修正侧敏(MSS)方案的基础上,开发了两种新的合成双采样(SDS)图,用于定位过程参数的监测。在本文中,我们首先给出了所提出的图表的操作,然后给出了声明一个抽样阶段为“符合”的概率的确切形式表达式。第三,我们从失控的平均运行长度、平均样本量、平均观测到的信号数量和平均额外二次损失等方面研究了所提出的图表的零状态和稳态性能。最后,我们将新图表的性能与一些知名图表进行了比较。我们观察到,所提出的图表具有吸引人的零状态和稳态特性,并且在许多情况下优于现有的SDS图表和所有其他竞争图表。为了便于设计和实现所提出的图表,文中给出了一个实际应用的例子。[收稿日期:2017年2月28日;修订日期:2018年3月14日;修订日期:2018年8月28日;录用日期:2018年10月4日]
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Side-sensitive synthetic double sampling X control charts
This paper develops two new synthetic double sampling (SDS) charts based on the revised side-sensitive (RSS) and modified side-sensitive (MSS) schemes for monitoring the location process parameter. In this paper, we first give the operation of the proposed charts and secondly, the exact form expression of the probability of declaring a sampling stage as 'conforming'. Thirdly, we investigate the zero-state and steady-state performances of the proposed charts in terms of the out-of-control average run-length, average sample size, average number of observations to signal and average extra quadratic loss. Finally, we compare the performance of the new charts with some well-known charts. It is observed that the proposed charts have attractive zero-state and steady-state properties and outperform the existing SDS chart and all other competing charts in many situations. An example of a real-life application is given to facilitate the design and implementation of the proposed charts. [Received: 28 February 2017; Revised: 14 March 2018; Revised: 28 August 2018; Accepted: 4 October 2018]
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